Atomic Electron Tomography: Past, Present and Future

Atomic Electron Tomography: Past, Present and Future

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Veröffentlicht in:Microscopy and microanalysis 2020-08, Vol.26 (S2), p.652-654
Hauptverfasser: Miao, Jianwei, Tian, Xuezeng, Kim, Dennis, Zhou, Jihan, Yang, Yongsoo, Yang, Yao, Yuan, Yakun, Ophus, Colin, Schmid, Andreas, Yang, Shize, Sun, Fan, Ciccarino, Christopher, Duschatko, Blake, Idrobo, Juan-Carlos, Narang, Prineha, Zeng, Hao, Ercius, Peter
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FIB-SEM Technology and Electron Tomography for Materials Science and Engineering
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container_title Microscopy and microanalysis
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creator Miao, Jianwei
Tian, Xuezeng
Kim, Dennis
Zhou, Jihan
Yang, Yongsoo
Yang, Yao
Yuan, Yakun
Ophus, Colin
Schmid, Andreas
Yang, Shize
Sun, Fan
Ciccarino, Christopher
Duschatko, Blake
Idrobo, Juan-Carlos
Narang, Prineha
Zeng, Hao
Ercius, Peter
description
doi_str_mv 10.1017/S143192762001541X
format Article
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subjects FIB-SEM Technology and Electron Tomography for Materials Science and Engineering
title Atomic Electron Tomography: Past, Present and Future
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