Magnetic linear dichroism studies of epitaxial CoO/NiO/MgO(001) system

Antiferromagnetic (AFM) CoO/NiO thin films are grown epitaxially on MgO(001) substrate and investigated by x-ray linear dichroism (XLD). Temperature-dependent measurement confirms that the observed XLD effect in this system originates entirely from the magnetic ordering. The temperature-dependent XM...

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Hauptverfasser: Jena, Bibhuti Bhusan, Mohanty, Smruti Ranjan, Kar, Arunava, Menon, Krishnakumar S. R.
Format: Tagungsbericht
Sprache:eng
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Zusammenfassung:Antiferromagnetic (AFM) CoO/NiO thin films are grown epitaxially on MgO(001) substrate and investigated by x-ray linear dichroism (XLD). Temperature-dependent measurement confirms that the observed XLD effect in this system originates entirely from the magnetic ordering. The temperature-dependent XMLD measurement indicates that the exchange coupling at the CoO/NiO interface can greatly enhance the Néeltemperature of the CoO layer. The XASof NiL2 edge shows the spin of the NiO in the system is in-plane.
ISSN:0094-243X
1551-7616
DOI:10.1063/5.0017498