Magnetic linear dichroism studies of epitaxial CoO/NiO/MgO(001) system
Antiferromagnetic (AFM) CoO/NiO thin films are grown epitaxially on MgO(001) substrate and investigated by x-ray linear dichroism (XLD). Temperature-dependent measurement confirms that the observed XLD effect in this system originates entirely from the magnetic ordering. The temperature-dependent XM...
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Format: | Tagungsbericht |
Sprache: | eng |
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Zusammenfassung: | Antiferromagnetic (AFM) CoO/NiO thin films are grown epitaxially on MgO(001) substrate and investigated by x-ray linear dichroism (XLD). Temperature-dependent measurement confirms that the observed XLD effect in this system originates entirely from the magnetic ordering. The temperature-dependent XMLD measurement indicates that the exchange coupling at the CoO/NiO interface can greatly enhance the Néeltemperature of the CoO layer. The XASof NiL2 edge shows the spin of the NiO in the system is in-plane. |
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ISSN: | 0094-243X 1551-7616 |
DOI: | 10.1063/5.0017498 |