An AIMD+U simulation of low-energy displacement events in UO2

In UO2, due to the existence of U 5f electrons, the strong-correlation effects are significant, and correction of on-site Coulomb interaction is necessary. For strongly-correlated electronic system like UO2, however, it is a challenge to consider such correction during simulation of their dynamic pr...

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Veröffentlicht in:Journal of nuclear materials 2020-11, Vol.540, p.152379, Article 152379
Hauptverfasser: Jiang, Ming, Gong, Hengfeng, Zhou, Birong, Xiao, Haiyan, Zhang, Haibin, Liu, Zijiang, Zu, Xiaotao
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Sprache:eng
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Zusammenfassung:In UO2, due to the existence of U 5f electrons, the strong-correlation effects are significant, and correction of on-site Coulomb interaction is necessary. For strongly-correlated electronic system like UO2, however, it is a challenge to consider such correction during simulation of their dynamic processes under radiation. In this study, a new method, i.e., AIMD + U, in which ab initio molecular dynamics method and correction of on-site Coulomb interaction between U 5f electrons are combined, is employed to investigate the response of UO2 to low energy radiation. The threshold displacement energies for O and U atoms have been determined, and defect creation and distribution have been provided. New mechanism for defect generation, and novel defect types, including uranium (oxygen) dumbbell interstitials and uranium antisite defects, are revealed from this study. •A new AIMD + U method is employed to investigate the radiation response of UO2.•Novel dumbbell interstitials and antisite defects are revealed.•Oxygen interstitial prefers to occupy octahedral sites.
ISSN:0022-3115
1873-4820
DOI:10.1016/j.jnucmat.2020.152379