Structural characterization and optical parameter of silicon phthalocyanine dichloride thin films dependence with gamma ray radiation

Silicon phthalocyanine dichloride (SiPcCl2) thin films was prepared using thermal evaporation technique. The optical and structural properties of the films were examined before and after gamma irradiation process. X-ray diffraction (XRD), Fourier-transform infrared (FTIR) and Scanning electron micro...

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Veröffentlicht in:	Radiation physics and chemistry (Oxford, England : 1993) England : 1993), 2020-11, Vol.176, p.109012, Article 109012
Hauptverfasser:	El- Mallah, H.M., Abd- El Salam, Mohamed, El- Damhogi, D.G., ELesh, E.
Format:	Artikel
Sprache:	eng
Schlagworte:	Carrier density Dichlorides Dispersion Energy dissipation Food irradiation Fourier transforms Gamma irradiation Gamma rays Optical properties Parameters Permittivity Silicon Silicon phthalocyanine dichloride Structural analysis Surface energy Thin films
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