Cross-sectional area measurement by optical and electrical resistance methods for subscale mechanical testing of near-net-shape titanium components
Sub-scale mechanical testing is very attractive for characterizing near-net-shape components by quickly producing large data sets with location- and orientation-specific information. This is particularly useful for titanium components produced by additive manufacturing and powder metallurgy, which h...
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Veröffentlicht in: | International journal of refractory metals & hard materials 2020-11, Vol.92, p.105265, Article 105265 |
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Sprache: | eng |
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Zusammenfassung: | Sub-scale mechanical testing is very attractive for characterizing near-net-shape components by quickly producing large data sets with location- and orientation-specific information. This is particularly useful for titanium components produced by additive manufacturing and powder metallurgy, which have highly process-dependent mechanical properties, complex build geometries, and limited material for testing. However, sub-scale tests require precise measurements of relatively small cross-sectional areas, which is cumbersome with traditional techniques. The authors have developed two alternative methods for quickly obtaining accurate cross-sectional areas of sub-scale titanium tensile specimens, which are referred to as the optical method and the electrical resistance method. Samples tested in this study had cross-sectional areas ranging from 0.184 to 1.12 mm2. The areas obtained using both methods were plotted against the areas obtained using a traditional contact micrometer. Both the optical and resistance methods showed a nearly 1:1 relationship with the traditional method and had very little variance among the data.
•Two area measurement methods for sub-scale tensile samples are proposed to characterize near-net-shape titanium components.•Cross-sectional areas of samples can be measured using a rotating sample mount, camera, ImageJ software, and Python code.•Alternatively, a four-point probe technique using material resistivity and Pouillet's Law can calculate sample area.•A nearly 1:1 relationship was shown between areas measured with traditional contact micrometers and with the above methods. |
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ISSN: | 0263-4368 2213-3917 |
DOI: | 10.1016/j.ijrmhm.2020.105265 |