Nanosecond carrier lifetimes in solution-processed enargite (Cu3AsS4) thin films
Enargite (ENG) Cu3AsS4 is a promising material for photovoltaic applications due to its constituent earth abundant elements of differing ionic radii, ideal predicted optoelectronic properties, and demonstrated use in a working thin-film solar cell. However, little is known about ENG's defect pr...
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Veröffentlicht in: | Applied physics letters 2020-10, Vol.117 (16) |
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Sprache: | eng |
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Zusammenfassung: | Enargite (ENG) Cu3AsS4 is a promising material for photovoltaic applications due to its constituent earth abundant elements of differing ionic radii, ideal predicted optoelectronic properties, and demonstrated use in a working thin-film solar cell. However, little is known about ENG's defect properties; such knowledge is necessary to assess its potential for future use in high-efficiency devices. One indicator of a material's quality is its photogenerated carrier lifetime, which can be related to its bulk defect properties. Here, we use a combination of time-resolved terahertz spectroscopy and time-resolved photoluminescence to assess carrier dynamics in ENG thin films processed from nanoparticle precursors. The Shockley–Read–Hall (SRH) lifetimes are on the multi-nanosecond scale, which exceed those reported in more mature systems and represent promising values for a candidate photovoltaic material. These results suggest that ENG is worthy of further research and development effort with an eye toward future photovoltaic applications. |
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ISSN: | 0003-6951 1077-3118 |
DOI: | 10.1063/5.0023246 |