Structure and Optical Properties of Chalcogenide Glassy As–Ge–Te Semiconductor
The structure and optical properties of a chalcogenide glassy As–Ge–Te semiconductor film are studied by X-ray diffraction analysis, Raman spectroscopy, and optical transmission and density measurement. The main structural elements and chemical bonds forming an amorphous matrix as well as the optica...
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| Veröffentlicht in: | Semiconductors (Woodbury, N.Y.) N.Y.), 2020-10, Vol.54 (10), p.1241-1246 |
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| container_end_page | 1246 |
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| container_issue | 10 |
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| container_title | Semiconductors (Woodbury, N.Y.) |
| container_volume | 54 |
| creator | Isayev, A. I. Mammadova, H. I. Mekhtiyeva, S. I. Alekberov, R. I. |
| description | The structure and optical properties of a chalcogenide glassy As–Ge–Te semiconductor film are studied by X-ray diffraction analysis, Raman spectroscopy, and optical transmission and density measurement. The main structural elements and chemical bonds forming an amorphous matrix as well as the optical width of the band gap are determined. The results are explained taking into account the main principles of chemical ordering and short-range order parameters in the atomic arrangement. |
| doi_str_mv | 10.1134/S1063782620100140 |
| format | Article |
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The results are explained taking into account the main principles of chemical ordering and short-range order parameters in the atomic arrangement.</description><subject>Analysis</subject><subject>Bonds</subject><subject>Chalcogenides</subject><subject>Chemical bonds</subject><subject>Composite Semiconductors</subject><subject>Density measurement</subject><subject>Equipment and supplies</subject><subject>Fiber optics</subject><subject>Magnetic Materials</subject><subject>Magnetism</subject><subject>Microcrystalline</subject><subject>Nanocrystalline</subject><subject>Optical properties</subject><subject>Order parameters</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>Porous</subject><subject>Raman spectroscopy</subject><subject>Semiconductors</subject><subject>Short range order</subject><subject>Structural members</subject><issn>1063-7826</issn><issn>1090-6479</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><recordid>eNp1kN9KwzAUxoMoOKcP4F3A62r-tGlzOYZOYTBx87pkycns6JqatBe78x18Q5_ElApeiBzIOSTf78vhQ-iakltKeXq3pkTwvGCCEUoITckJmlAiSSLSXJ4Os-DJ8H6OLkLYRwktsnSCXtad73XXe8CqMXjVdpVWNX72rgXfVRCws3j-pmrtdtBUBvCiViEc8Sx8fXwuIB4bwGs4VNo1Jjo5f4nOrKoDXP30KXp9uN_MH5PlavE0ny0TzbOsS7QUICkXGZfEMsMI11SBLoQRtiAZL_JtDsISK3PKc11wZqiQBUuNzcWWEz5FN6Nv6917D6Er9673TfyyZGlGOKdUDqrbUbVTNZRVY13nlY5lxp3BVvF-FsOTOc8KFgE6Atq7EDzYsvXVQfljSUk5ZF3-yToybGRC1DY78L-r_A99A7EYgD8</recordid><startdate>20201001</startdate><enddate>20201001</enddate><creator>Isayev, A. 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| ispartof | Semiconductors (Woodbury, N.Y.), 2020-10, Vol.54 (10), p.1241-1246 |
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| language | eng |
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| source | SpringerLink Journals |
| subjects | Analysis Bonds Chalcogenides Chemical bonds Composite Semiconductors Density measurement Equipment and supplies Fiber optics Magnetic Materials Magnetism Microcrystalline Nanocrystalline Optical properties Order parameters Physics Physics and Astronomy Porous Raman spectroscopy Semiconductors Short range order Structural members |
| title | Structure and Optical Properties of Chalcogenide Glassy As–Ge–Te Semiconductor |
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