Nonlinear optical measurements of CdSiP2 at near and mid-infrared wavelengths

Nonlinear optical measurements of CdSiP2 at near and mid-infrared wavelengths

We measure the birefringence of the nonlinear optical (NLO) properties of cadmium silicon phosphide via the Z-scan technique at near and mid-infrared wavelengths. We discuss the implications of the NLO properties on optical parametric amplifier performance. We find that the nonlinear absorption does...

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Veröffentlicht in:Optical materials express 2020-09, Vol.10 (9), p.2066
Hauptverfasser: Ferdinandus, Manuel R, Gengler, Jamie J, Averett, Kent L, Zawilski, Kevin T, Schunemann, Peter G, Liebig, Carl M
Format: Artikel
Sprache:eng
Schlagworte:
Birefringence
Nonlinear optics
Optical measurement
Optical properties
Parametric amplifiers
Phosphides
Wavelengths
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Zusammenfassung:We measure the birefringence of the nonlinear optical (NLO) properties of cadmium silicon phosphide via the Z-scan technique at near and mid-infrared wavelengths. We discuss the implications of the NLO properties on optical parametric amplifier performance. We find that the nonlinear absorption does reduce the conversion efficiency, while the nonlinear refraction has a negligible effect.
ISSN:2159-3930
DOI:10.1364/OME.399516