Studying the effect of low doses of gamma and beta irradiations on graphene oxide samples

Graphene oxide (GO) sheets have many applications such as biomedical, solar cells, batteries, supercapacitors and biosensors. The product of GO sheets was irradiated in the air by gamma-rays (60Co source) and beta particles (90Sr source). Positron Annihilation Doppler-Broadening technique was used t...

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Veröffentlicht in:Radiation physics and chemistry (Oxford, England : 1993) England : 1993), 2020-08, Vol.173, p.108941, Article 108941
Hauptverfasser: Yasein, M., Eissa, M.F., El-Fayoumi, M.A.K., Abood, Ahmed A., Badawi, Emad A., Aly, Arafa H.
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Sprache:eng
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Zusammenfassung:Graphene oxide (GO) sheets have many applications such as biomedical, solar cells, batteries, supercapacitors and biosensors. The product of GO sheets was irradiated in the air by gamma-rays (60Co source) and beta particles (90Sr source). Positron Annihilation Doppler-Broadening technique was used to study the effect of radiation on GO samples. The interlayer spacing (d-spacing) of GO layers was measured by X-ray diffraction before and after irradiation processes. The d-spacing of GO was decreased after beta particles and gamma-ray irradiation. Raman spectroscopy measurements were performed on irradiated and non-irradiated GO samples. The measured data showed that the disorder parameter defect ratio for the gamma-ray irradiation was decreased. Fourier transform infrared spectra were applied to obtain information on the functional groups attached to irradiated and non-irradiated GO samples. The results obtained a reduction in oxygen-functional groups of the GO samples as well as the optical absorption spectra of all samples were measured. •GO samples were irradiated by beta particle and gamma-ray radiations doses.•The characterization processes were performed using PADBS, FT-IR, UV-Vis, XRD, and Raman Spectroscopy.•Significant changes in the chemical structure of irradiated GO samples.•Significant effects of background radiation on GO-based on components in the long-term.
ISSN:0969-806X
1879-0895
DOI:10.1016/j.radphyschem.2020.108941