Variable Range Hopping Resistivity in La2-xSrxCuO4 Nanoparticles Evaluated by Four Point Probe Method
We report the results of the resistivity measurement on La2-xSrxCuO4 nanoparticles with x = 0, 0.05, and 0.20 evaluated by the four-point probe method. The high resistivity value shows the predominance of the inter-grain part. The temperature dependence of the conductivity can be analyzed by variabl...
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| Veröffentlicht in: | Key engineering materials 2020-08, Vol.860, p.142-147 |
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| container_title | Key engineering materials |
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| creator | Watanabe, Isao Budiman, Faisal Goto, Takayuki Tanaka, Hirofumi Winarsih, Suci Soegijono, Bambang Kurniawan, Budhy Adachi, Tadashi |
| description | We report the results of the resistivity measurement on La2-xSrxCuO4 nanoparticles with x = 0, 0.05, and 0.20 evaluated by the four-point probe method. The high resistivity value shows the predominance of the inter-grain part. The temperature dependence of the conductivity can be analyzed by variable range hopping model showing the charge carriers are formed by thermal activation. There is no superconducting behavior that could be observed in La2-xSrxCuO4 nanoparticles with x = 0.05 and 0.20. |
| doi_str_mv | 10.4028/www.scientific.net/KEM.860.142 |
| format | Article |
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The high resistivity value shows the predominance of the inter-grain part. The temperature dependence of the conductivity can be analyzed by variable range hopping model showing the charge carriers are formed by thermal activation. There is no superconducting behavior that could be observed in La2-xSrxCuO4 nanoparticles with x = 0.05 and 0.20.</description><subject>Current carriers</subject><subject>Electrical resistivity</subject><subject>Evaluation</subject><subject>Four point probe method</subject><subject>Nanoparticles</subject><subject>Temperature dependence</subject><issn>1013-9826</issn><issn>1662-9795</issn><issn>1662-9795</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2020</creationdate><recordtype>article</recordtype><sourceid>AFKRA</sourceid><sourceid>BENPR</sourceid><sourceid>CCPQU</sourceid><sourceid>DWQXO</sourceid><recordid>eNqNkNtKxDAQhosoqKvvEBC8a82ph9yIsuyquLrLergNaTvVSE1rku7h7Y2s4K1XMwM_3z98UXROcMIxLS7W63XiKg3G60ZXiQF_cT95SIoMJ4TTveiIZBmNRS7S_bBjwmJR0OwwOnbuA2NGCpIeRfCqrFZlC2ipzBug267vtXlDS3Daeb3Sfou0QTNF482T3YyHOUePynS9sl5XLTg0Wal2UB5qVG7RtBssWnTaeLSwXQnoAfx7V59EB41qHZz-zlH0Mp08j2_j2fzmbnw9iyvGchorCnktSMbTlDclBRC8oYLWNGeiKmveZCmpmMgUlCzPKQ63SnNGFVdNAUKwUXS24_a2-xrAefkRHjKhUlLOCpxmmNGQutylKts5Z6GRvdWfym4lwfJHrQxq5Z9aGdTKoFYGtTKoDYCrHcBbZZyH6v2v55-Ib-0LirI</recordid><startdate>20200801</startdate><enddate>20200801</enddate><creator>Watanabe, Isao</creator><creator>Budiman, Faisal</creator><creator>Goto, Takayuki</creator><creator>Tanaka, Hirofumi</creator><creator>Winarsih, Suci</creator><creator>Soegijono, Bambang</creator><creator>Kurniawan, Budhy</creator><creator>Adachi, Tadashi</creator><general>Trans Tech Publications Ltd</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7SR</scope><scope>8BQ</scope><scope>8FD</scope><scope>8FE</scope><scope>8FG</scope><scope>ABJCF</scope><scope>AFKRA</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>F28</scope><scope>FR3</scope><scope>HCIFZ</scope><scope>JG9</scope><scope>KB.</scope><scope>L6V</scope><scope>M7S</scope><scope>PDBOC</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>PTHSS</scope></search><sort><creationdate>20200801</creationdate><title>Variable Range Hopping Resistivity in La2-xSrxCuO4 Nanoparticles Evaluated by Four Point Probe Method</title><author>Watanabe, Isao ; 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The high resistivity value shows the predominance of the inter-grain part. The temperature dependence of the conductivity can be analyzed by variable range hopping model showing the charge carriers are formed by thermal activation. There is no superconducting behavior that could be observed in La2-xSrxCuO4 nanoparticles with x = 0.05 and 0.20.</abstract><cop>Zurich</cop><pub>Trans Tech Publications Ltd</pub><doi>10.4028/www.scientific.net/KEM.860.142</doi><tpages>6</tpages></addata></record> |
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| subjects | Current carriers Electrical resistivity Evaluation Four point probe method Nanoparticles Temperature dependence |
| title | Variable Range Hopping Resistivity in La2-xSrxCuO4 Nanoparticles Evaluated by Four Point Probe Method |
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