Variable Range Hopping Resistivity in La2-xSrxCuO4 Nanoparticles Evaluated by Four Point Probe Method

We report the results of the resistivity measurement on La2-xSrxCuO4 nanoparticles with x = 0, 0.05, and 0.20 evaluated by the four-point probe method. The high resistivity value shows the predominance of the inter-grain part. The temperature dependence of the conductivity can be analyzed by variabl...

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Veröffentlicht in:	Key engineering materials 2020-08, Vol.860, p.142-147
Hauptverfasser:	Watanabe, Isao, Soegijono, Bambang, Budiman, Faisal, Goto, Takayuki, Winarsih, Suci, Kurniawan, Budhy, Adachi, Tadashi, Tanaka, Hirofumi
Format:	Artikel
Sprache:	eng
Schlagworte:	Current carriers Electrical resistivity Evaluation Four point probe method Nanoparticles Temperature dependence
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Zusammenfassung:	We report the results of the resistivity measurement on La2-xSrxCuO4 nanoparticles with x = 0, 0.05, and 0.20 evaluated by the four-point probe method. The high resistivity value shows the predominance of the inter-grain part. The temperature dependence of the conductivity can be analyzed by variable range hopping model showing the charge carriers are formed by thermal activation. There is no superconducting behavior that could be observed in La2-xSrxCuO4 nanoparticles with x = 0.05 and 0.20.
ISSN:	1013-9826 1662-9795 1662-9795
DOI:	10.4028/www.scientific.net/KEM.860.142