Double- and Triple-Crystal X-Ray Diffraction Analysis of Face-Grown Gd3Ga3Al2O12:Ce Crystals

Crystals of gadolinium–gallium–aluminum garnet doped with cerium ions (Gd 3 Ga 3 Al 2 O 12 :Ce) are analyzed by X-ray diffractometry and X-ray topography. These crystals have a number of unique scintillation characteristics (including a high specific light yield, fast emission kinetics, and high energy and time resolutions), which make them promising for designing detectors of ionizing radiation in a wide energy range. It is shown that the methods used make it possible to carry out the further optimization of preparation processes of bulk crystals by revealing specific features of their growth (e.g., facet inhomogeneity, which is characteristic of Czochralski-grown single crystals).