On the Resistance of Electronic Components to the Action of Radiation

The analysis of the effect of radiation exposure on integrated circuits is carried out. The methods of constructing passively fault tolerant irradiated microcircuits are considered. A review of a method for indirectly measuring the fault tolerance of such microcircuits built using various constant e...

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Veröffentlicht in:	Journal of contemporary physics 2020-04, Vol.55 (2), p.176-182
Hauptverfasser:	Alexandrov, P. A., Efimenko, E. V.
Format:	Artikel
Sprache:	eng
Schlagworte:	Electronic components Fault tolerance Integrated circuits Particle and Nuclear Physics Physics Physics and Astronomy Radiation effects Redundancy
Online-Zugang:	Volltext
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Beschreibung
Zusammenfassung:	The analysis of the effect of radiation exposure on integrated circuits is carried out. The methods of constructing passively fault tolerant irradiated microcircuits are considered. A review of a method for indirectly measuring the fault tolerance of such microcircuits built using various constant element-by-element redundancy and without redundancy is given.
ISSN:	1068-3372 1934-9378
DOI:	10.3103/S1068337220020036