Imaging the Nanophase-separated Structure of Block Copolymer Thin Film by Atomic Force Microscopy in Aqueous Solution

We employed two modes of atomic force microscopy to characterize the nanophase-separated structure of a block copolymer thin film from poly(2-methacryloyloxyethyl phosphorylcholine) and poly(3-(methacryloyloxy) propyl-tris(trimethylsilyloxy) silane) in aqueous solution. The force-spectroscopic mappi...

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Veröffentlicht in:Chemistry letters 2020-06, Vol.49 (6), p.641-644
Hauptverfasser: Suthiwanich, Kasinan, Hiraguchi, Yukari, Nyu, Takashi, Mondarte, Evan Angelo Quimada, Takai, Madoka, Hayashi, Tomohiro
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Sprache:eng
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Zusammenfassung:We employed two modes of atomic force microscopy to characterize the nanophase-separated structure of a block copolymer thin film from poly(2-methacryloyloxyethyl phosphorylcholine) and poly(3-(methacryloyloxy) propyl-tris(trimethylsilyloxy) silane) in aqueous solution. The force-spectroscopic mapping mode clearly revealed a mismatch between nanophase arrangement and topography. This mode resolved the nanophase arrangement better than the amplitude-modulated scanning mode, whose phase-delay images were more common in visualizing the chemical distribution. Nevertheless, characterization with both modes allowed us to deduce the three-dimensional structure of the copolymeric films.
ISSN:0366-7022
1348-0715
DOI:10.1246/cl.190894