Development of a High-Rate Front-End ASIC for X-Ray Spectroscopy and Diffraction Applications

We developed a new front-end application-specific integrated circuit (ASIC) to upgrade the Maia X-ray microprobe. The ASIC instruments 32 configurable channels that perform either positive or negative charge amplification, pulse shaping, peak amplitude, and time extraction along with buffered analog...

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Veröffentlicht in:IEEE transactions on nuclear science 2020-04, Vol.67 (4), p.752-759
Hauptverfasser: Vernon, Emerson, De Geronimo, Gianluigi, Baldwin, Jonathan, Chen, Wei, Fried, Jack, Giacomini, Gabriele, Kuczewski, Anthony, Kuczewski, John, Mead, Joe, Miceli, Antonino, Okasinski, John S., Pinelli, Don, Quaranta, Orlando, Rumaiz, Abdul K., Siddons, Peter, Smith, Graham, Stanacevic, Milutin, Woods, Russell
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Sprache:eng
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Zusammenfassung:We developed a new front-end application-specific integrated circuit (ASIC) to upgrade the Maia X-ray microprobe. The ASIC instruments 32 configurable channels that perform either positive or negative charge amplification, pulse shaping, peak amplitude, and time extraction along with buffered analog storage. At a gain of 3.6 V/fC, 1- \mu \text{s} peaking time, and a temperature of 248 K, an electronic resolution of 13 and 10 e^{-} rms was measured with and without a silicon drift detector (SDD) sensor, respectively. A spectral resolution of 170-eV full-width at half-maximum (FWHM) at 5.9 keV was obtained with an 55 Fe source. The channel linearity was better than ± 1 % with rate capabilities up to 40 kcps. The ASIC was fabricated in a commercial 250-nm process with a footprint of 6.3 mm \times 3.9 mm and dissipates 167 mW of static power.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.2020.2976820