[100] Directional alignment of Ni-based single- crystal superalloys to measure orientation and accurate misfit between γ and γ’ phases via high-resolution X-ray diffraction

Although it is important to measure the lattice misfit and orientation in Ni-based single-crystal superalloys to predict their mechanical properties, it is difficult to measure the exact orientation and lattice misfit owing to deviations between the surface and growth direction using conventional x-ray diffraction. Therefore, we developed the growth directional alignment method to measure the orientation and misfit accurately via high-resolution x-ray diffraction. Using this method, we obtained the dominant orientation information both for the out-of-surface and in-surface directions. Moreover, we could achieve sufficient angular resolution during diffraction to measure the lattice misfit between the γ and γ’ phases. [Display omitted] •The theoretical model for [100] directional alignment was developed.•This method could enhance intensity of diffraction significantly via HRXRD.•The orientation information could be achieved overcoming the limitations of EBSD.•This can provide accurate lattice misfit compared to that of synchrotron or neutron studies.