Triple GEM performance in magnetic field

Triple GEM performance in magnetic field

Performance of triple GEM prototypes in strong magnetic field has been evaluated by means of a muon beam at the H4 line of the SPS test area at CERN. Data have been reconstructed and analyzed offline with two reconstruction methods: the charge centroid and the micro-Time-Projection-Chamber exploitin...

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Veröffentlicht in:Journal of instrumentation 2019-08, Vol.14 (8), p.P08018-P08018
Hauptverfasser: Alexeev, M., Amoroso, A., Bagnasco, S., Ferroli, R. Baldini, Balossino, I., Bencivenni, G., Bertani, M., Bettoni, D., Bianchi, F., Bortone, A., Calcaterra, A., Capodiferro, M., Carassiti, V., Cerioni, S., Chai, J., Cheng, W., Chiozzi, S., Cibinetto, G., Ramusino, A. Cotta, Cotto, G., Cossio, F., Rolo, M. Da Rocha, Mori, F. De, Destefanis, M., Domenici, D., Dong, J., Evangelisti, F., Farinelli, R., Fava, L., Felici, G., Fioravanti, E., Gaido, L., Garzia, I., Gatta, M., Giraudo, G., Gramigna, S., Greco, M., Lavezzi, L., Leng, C., Li, H., Li, P., Lusso, S., Maggiora, M., Malaguti, R., Mangoni, A., Marcello, S., Melchiorri, M., Mezzadri, G., Morello, G., Mignone, M., Pace, E., Pacetti, S., Papalino, G., Passalacqua, B., Patteri, P., Pelosi, A., Lener, M. Poli, Rivetti, A., Savrié, M., Scodeggio, M., Sosio, S., Spataro, S., Tskhadadze, E., Verma, S., Yang, L., Wang, B., Weadon, R.J., Zhang, J.
Format: Artikel
Sprache:eng
Schlagworte:
Algorithms
Centroids
Magnetic fields
Muons
Particle beams
Spatial resolution
Synchrotrons
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Zusammenfassung:Performance of triple GEM prototypes in strong magnetic field has been evaluated by means of a muon beam at the H4 line of the SPS test area at CERN. Data have been reconstructed and analyzed offline with two reconstruction methods: the charge centroid and the micro-Time-Projection-Chamber exploiting the charge and the time measurement respectively. Depending on the combination of the particle incident angle and magnetic filed, there's always one of the two algorithms achieving a spatial resolution of 100–120 μm.
ISSN:1748-0221
1748-0221
DOI:10.1088/1748-0221/14/08/P08018