Electronic structure of semiconductor nanostructures: A modified localization landscape theory
In this paper we present a modified localization landscape theory to calculate localized/confined electron and hole states and the corresponding energy eigenvalues without solving a (large) eigenvalue problem. We motivate and demonstrate the benefit of solving (H) over cap (2)u = 1 in the modified l...
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Veröffentlicht in: | Physical review. B 2020-01, Vol.101 (3), p.1, Article 035430 |
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Sprache: | eng |
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Zusammenfassung: | In this paper we present a modified localization landscape theory to calculate localized/confined electron and hole states and the corresponding energy eigenvalues without solving a (large) eigenvalue problem. We motivate and demonstrate the benefit of solving (H) over cap (2)u = 1 in the modified localization landscape theory in comparison to (H) over capu = 1, solved in the localization landscape theory. We detail the advantages by fully analytic considerations before targeting the numerical calculation of electron and hole states and energies in III-N heterostructures. We further discuss how the solution of (H) over cap (2)u = 1 is used to extract an effective potential W that is comparable to the effective potential obtained from (H) over cap (2)u = 1, ensuring that it can for instance be used to introduce quantum corrections to drift-diffusion transport calculations. Overall, we show that the proposed modified localization landscape theory keeps all the benefits of the localization landscape theory but further improves factors such as convergence of the calculated energies and the robustness of the method against the chosen integration region for u to obtain the corresponding energies. We find that this becomes especially important for here studied c-plane InGaN/GaN quantum wells with higher In contents. All these features make the proposed approach very attractive for calculation of localized states in highly disordered systems, where partitioning the systems into different subregions may be difficult. |
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ISSN: | 2469-9950 2469-9969 |
DOI: | 10.1103/PhysRevB.101.035430 |