Demonstration of a GaN/AlGaN Superlattice-Based p-Channel FinFET With High ON-Current
In this letter, we report on the demonstration of a Mg-doped GaN/Al 0.2 Ga 0.8 N superlattice (SL) based depletion mode p-channel FinFET to improve the on current (I ON ). A two-step approach involving a dry etch followed by a Tetramethylammonium hydroxide (TMAH) wet etch was employed to obtain fins...
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Veröffentlicht in: | IEEE electron device letters 2020-02, Vol.41 (2), p.220-223 |
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Hauptverfasser: | , , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | In this letter, we report on the demonstration of a Mg-doped GaN/Al 0.2 Ga 0.8 N superlattice (SL) based depletion mode p-channel FinFET to improve the on current (I ON ). A two-step approach involving a dry etch followed by a Tetramethylammonium hydroxide (TMAH) wet etch was employed to obtain fins with minimum width of 50 nm using optical lithography. Normalizing current with fin height, an I ON of 52 mA/mm and 110 mA/mm were achieved for 80 and 105 nm wide fins respectively. |
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ISSN: | 0741-3106 1558-0563 |
DOI: | 10.1109/LED.2019.2963428 |