Demonstration of a GaN/AlGaN Superlattice-Based p-Channel FinFET With High ON-Current

In this letter, we report on the demonstration of a Mg-doped GaN/Al 0.2 Ga 0.8 N superlattice (SL) based depletion mode p-channel FinFET to improve the on current (I ON ). A two-step approach involving a dry etch followed by a Tetramethylammonium hydroxide (TMAH) wet etch was employed to obtain fins...

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Veröffentlicht in:IEEE electron device letters 2020-02, Vol.41 (2), p.220-223
Hauptverfasser: Raj, Aditya, Krishna, Athith, Hatui, Nirupam, Gupta, Chirag, Jang, Raina, Keller, Stacia, Mishra, Umesh K.
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Sprache:eng
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Zusammenfassung:In this letter, we report on the demonstration of a Mg-doped GaN/Al 0.2 Ga 0.8 N superlattice (SL) based depletion mode p-channel FinFET to improve the on current (I ON ). A two-step approach involving a dry etch followed by a Tetramethylammonium hydroxide (TMAH) wet etch was employed to obtain fins with minimum width of 50 nm using optical lithography. Normalizing current with fin height, an I ON of 52 mA/mm and 110 mA/mm were achieved for 80 and 105 nm wide fins respectively.
ISSN:0741-3106
1558-0563
DOI:10.1109/LED.2019.2963428