Investigation of lead surface segregation during germanium–lead epitaxial growth

Crystalline germanium–lead (GePb) alloys were deposited on Ge(100) substrates via magnetron sputtering epitaxy. Strip-shaped Pb segregation along the direction was observed on the Ge 0.976 Pb 0.024 film surface, as revealed by scanning electron microscopy. The chemical compositions and structural pr...

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Veröffentlicht in:	Journal of materials science 2020-04, Vol.55 (11), p.4762-4768
Hauptverfasser:	Liu, Xiangquan, Zheng, Jun, Li, Xiuli, Niu, Chaoqun, Peng, Linzhi, Wan, Fengshuo, Liu, Zhi, Zuo, Yuhua, Xue, Chunlai, Cheng, Buwen
Format:	Artikel
Sprache:	eng
Schlagworte:	Alloys Characterization and Evaluation of Materials Chemical composition Chemistry and Materials Science Classical Mechanics Crystallography and Scattering Methods Electron microscopes Electron microscopy Electronic Materials Electronics industry Epitaxial growth Epitaxy Germanium Magnetron sputtering Materials Science Microscopy Organic chemistry Polymer Sciences Raman spectra Solid Mechanics Spectrum analysis Strip Substrates
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Zusammenfassung:	Crystalline germanium–lead (GePb) alloys were deposited on Ge(100) substrates via magnetron sputtering epitaxy. Strip-shaped Pb segregation along the direction was observed on the Ge 0.976 Pb 0.024 film surface, as revealed by scanning electron microscopy. The chemical compositions and structural properties of the strip-shaped segregation were investigated by energy-dispersive X-ray spectroscopy, cross-sectional transmission electron microscopy and micro-Raman scattering spectra. The Ge 0.976 Pb 0.024 film remained high crystal quality even after Pb segregation. The strip-shaped segregation was mainly composed of polycrystalline Pb, and its surface was covered with a GePb nanocrystalline layer.
ISSN:	0022-2461 1573-4803
DOI:	10.1007/s10853-019-04334-6