Correction to: Preparation and photoluminescence of NiFe2O4 nanoparticles

Correction to: Preparation and photoluminescence of NiFe2O4 nanoparticles

In the original version, all the peaks are indexed in all figures expect the two small peaks at 72.08 and 75.54 °; they are assigned to the diffraction plane of the hematite phase (1010) and (220) (JCPDS card number 00-001-1053). The peaks located at 71.5 and 74.5° are assigned to the diffraction pl...

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Veröffentlicht in:Journal of materials science. Materials in electronics 2020, Vol.31 (1), p.859-860
Hauptverfasser: Hjiri, M., Alonizan, N. H., Althubayti, M. M., Alshammari, S., Besbes, H., Aida, M. S.
Format: Artikel
Sprache:eng
Schlagworte:
Characterization and Evaluation of Materials
Chemistry and Materials Science
Correction
Materials Science
Optical and Electronic Materials
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Zusammenfassung:In the original version, all the peaks are indexed in all figures expect the two small peaks at 72.08 and 75.54 °; they are assigned to the diffraction plane of the hematite phase (1010) and (220) (JCPDS card number 00-001-1053). The peaks located at 71.5 and 74.5° are assigned to the diffraction plans (620) and (533) of the spinel phase, respectively.
ISSN:0957-4522
1573-482X
DOI:10.1007/s10854-019-02750-7