The compression stress-strain behavior of Sn-Ag-Cu solder
The effect of the 125[degrees]C, 24 h aging treatment on the yield stress was also evaluated for the Sn-Ag-Cu solders tested at the slower strain rate of 4.2 x 10^sup -5^s^sup -1^. The mean yield-stress data are shown in Figure 4. The as-cast and aged samples are represented by solid symbols and ope...
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Veröffentlicht in: | JOM (1989) 2003-06, Vol.55 (6), p.50-55 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | The effect of the 125[degrees]C, 24 h aging treatment on the yield stress was also evaluated for the Sn-Ag-Cu solders tested at the slower strain rate of 4.2 x 10^sup -5^s^sup -1^. The mean yield-stress data are shown in Figure 4. The as-cast and aged samples are represented by solid symbols and open symbols, respectively. The aging treatment generally resulted in lower yield-stress values over the range of test temperatures. |
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ISSN: | 1047-4838 1543-1851 |
DOI: | 10.1007/s11837-003-0141-8 |