X-ray diffraction method for quantitative estimation of elastic modulus in materials with gradient structure

The efficiency of X-ray diffraction (XRD) method for quantitative estimation of elastic modulus in materials with gradient structure have been demonstrated in the paper. This method was used to calculate the elastic modulus for NiTi samples irradiated at a beam energy E= 15 J/cm2 and pulse duration...

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Hauptverfasser: Ostapenko, Marina, Meisner, Ludmila
Format: Tagungsbericht
Sprache:eng
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Zusammenfassung:The efficiency of X-ray diffraction (XRD) method for quantitative estimation of elastic modulus in materials with gradient structure have been demonstrated in the paper. This method was used to calculate the elastic modulus for NiTi samples irradiated at a beam energy E= 15 J/cm2 and pulse duration τ = 150 µsx. It is determined that the compared values of XRD elastic modulus E(hkl, ψ) and elastic modulus En obtained for the same samples by nanoindentation are close.
ISSN:0094-243X
1551-7616
DOI:10.1063/1.5132124