Present status of photoemission electron microscope newly installed in SPring-8 for time-resolved nanospectroscopy

A photoemission electron microscope (PEEM) system has been newly installed at the soft X-ray undulator beamline (BL17SU) of SPring-8 to realize time-resolved nanospectroscopy for the local transient electronic structures of advanced materials. This PEEM is a versatile machine composed of an electros...

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Veröffentlicht in:	Japanese Journal of Applied Physics 2019-11, Vol.58 (11), p.118001
Hauptverfasser:	Ohkochi, Takuo, Osawa, Hitoshi, Yamaguchi, Akinobu, Fujiwara, Hidenori, Oura, Masaki
Format:	Artikel
Sprache:	eng
Schlagworte:	Electron microscopes Femtosecond pulsed lasers Photoelectric emission Soft x rays
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Beschreibung
Zusammenfassung:	A photoemission electron microscope (PEEM) system has been newly installed at the soft X-ray undulator beamline (BL17SU) of SPring-8 to realize time-resolved nanospectroscopy for the local transient electronic structures of advanced materials. This PEEM is a versatile machine composed of an electrostatic lens system and is intended for use in specific experiments such as time-resolved measurements. Pump-probe measurements in tandem with a femtosecond pulsed-laser system and an X-ray chopper are now readily available.
ISSN:	0021-4922 1347-4065
DOI:	10.7567/1347-4065/ab4b12