Ceramic resistors as optically stimulated luminescent retrospective dosimeters
Application of optically stimulated luminescence (OSL) as a retrospective dosimetric technique is studied using ceramic resistors available in commonly used instruments like personal computers, printers, household electronic appliances etc. In order to understand the OSL process the composition of t...
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Veröffentlicht in: | Radiation physics and chemistry (Oxford, England : 1993) England : 1993), 2019-12, Vol.165, p.108436, Article 108436 |
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Sprache: | eng |
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Zusammenfassung: | Application of optically stimulated luminescence (OSL) as a retrospective dosimetric technique is studied using ceramic resistors available in commonly used instruments like personal computers, printers, household electronic appliances etc. In order to understand the OSL process the composition of the ceramic resistors was analysed using XRD, FTIR and ED-XRF techniques and it is found to have hydrated calcium aluminium silicate as the major constituent along with trace impurities for the origin of radiation induced OSL. The important retrospective dosimetric characteristics like its OSL sensitivity, reproducibility, OSL dose response and stability of the signal upon storage after exposure have been studied. The dose response was found to be linear from 100 mGy to 5 Gy. It is also observed that the OSL signal decreases by 30% in the first 3 days and thereafter there is negligible fading up to 30 days. The correlation between TL and OSL signals in the material was also studied. Using Single Aliquot Regenerative (SAR) technique, the dose was recovered with very good accuracy. These dosimetric studies showed that carbon film ceramic resistors have potential use as emergency dosimeter.
•Studied the ceramic resistors as retrospective dosimeter using OSL technique.•Ceramic resistor mainly contains Ca, Al and Si in the form of hydrated silicate.•OSL signal is linear from 100 mGy to 5 Gy with minimum detectable dose of 100 mGy.•OSL signal fades 30% in 3 days and an additional 10% for 30 days storage at RT. |
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ISSN: | 0969-806X 1879-0895 |
DOI: | 10.1016/j.radphyschem.2019.108436 |