Ion-beam Investigation in a 1.5-kJ Dense Plasma Focus Device

An investigation of energetic ion beam emission from a low-energy (1.5 kJ) Mather-type plasma focus (PF) device operating with argon gas is studied with an operating pressure ranging from 2 × 10 −2 to 1 Torr. The device has been energized by 30.84-μF capacitors charged up to 10 kV, giving a peak discharge current up to 120 kA with a rise time of 3 μs. A Faraday cup (FC) and its operation has been studied. This device is utilized to perform time-of-flight (TOF) measurements in order to characterize the beams of charged particles. The FC is placed at 20 cm from the tip of anode electrode at 0° with respect to anode axis to detect the ions. The FC operating in bias ion collector mode has been developed for measuring and characterizing pulsed ion beam. Energy and velocity of ions are determined with the TOF method, taking into account distance from the center electrode to the detection plane. The surface morphology of the pristine and irradiated ZnOCo 0.04 samples is investigated as imaged by scanning electron microscope (SEM). The untreated sample showed rather relatively smooth surface; meanwhile, the SEM micrographs of bombarded samples display numerous small voids on the surface of the ZnOCo 0.04 samples as a result of ion beam emission from PF device. X-ray fluorescence analysis showed that there are some new elements appeared on the surface of the sample after exposed to the ion beam; these elements and their concentrations are recorded. The surface roughness values for the pristine and the irradiated ZnOCo 0.04 sample with Ar ion beam at different plasma shots are measured. A Vickers microhardness tester is used to measure the surface hardness, and the results demonstrate a significant increase in the hardness depending on the ion dose and decreases by increasing the applied load at 0° angular position.