Experimental Validation of Conifer and Broad-Leaf Tree Classification Using High Resolution PolSAR Data above X-Band

This paper presents a conifer and broad-leaf tree classification scheme that processes high resolution polarimetric synthetic aperture data above X-band. To validate the proposal, fully polarimetric measurements are conducted in a precisely controlled environment to examine the difference between th...

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Veröffentlicht in:IEICE Transactions on Communications 2019/07/01, Vol.E102.B(7), pp.1345-1350
Hauptverfasser: YAMAGUCHI, Yoshio, MINETANI, Yuto, UMEMURA, Maito, YAMADA, Hiroyoshi
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Sprache:eng
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Zusammenfassung:This paper presents a conifer and broad-leaf tree classification scheme that processes high resolution polarimetric synthetic aperture data above X-band. To validate the proposal, fully polarimetric measurements are conducted in a precisely controlled environment to examine the difference between the scattering mechanisms of conifer and broad-leaf trees at 15GHz. With 3.75cm range resolution, scattering matrices of two tree types were measured by a vector network analyzer. Polarimetric analyses using the 4-component scattering power decomposition and alpha-bar angle of eigenvalue decomposition yielded clear distinction between the two tree types. This scheme was also applied to an X-band Pi-SAR2 data set. The results confirm that it is possible to distinguish between tree types using fully polarimetric and high-resolution data above X-band.
ISSN:0916-8516
1745-1345
DOI:10.1587/transcom.2018EBP3288