Electronic polarizability, dielectric, and gamma-ray shielding properties of some tellurite-based glasses

In this study, five samples of tellurite-based glasses with chemical composition TeO 2 –ZnO–NiO coded as (TZN1–TZN5) have been reported to investigate their optical and gamma-ray shielding properties. Index of refraction ( n o ), molar refraction ( R M ), molar polarizability ( α M ), metallization property ( M ), and static dielectric constant ( ε ) for all the proposed glasses have been determined. Mass attenuation coefficients ( μ / ρ ) for the proposed glasses were calculated by Geant4 simulation code and WinXCOM software in the photon energy region 0.001–10 MeV. The obtained values from these methods were compared, and the correlation factor for each glass sample ( R 2 ) value was found to be 0.999. Based on the obtained values of μ / ρ and densities of the samples, different γ-ray shielding parameters such as half-value layer (HVL), effective atomic number ( Z eff ), and mean free path were evaluated. The HVL values for the selected glasses decreased in the order TZN1