The study of converse piezoelectric-effect of ZnO thin film

Polycrystalline ZnO thin film has been deposited on Si cantilever beam substrate by pulsed laser deposition (PLD) technique. The high-resolution x-ray diffraction (HR-XRD) analysis suggests the formation of wurtzite structure along c-axis. The atomic force microscopy (AFM) measurement reveals the gr...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Guchhait, Suman, Ahmad, Aquil, Aireddy, H., Das, A. K.
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Atomic force microscopy Cantilever beams Laser beams Microscopes Photovoltaic cells Piezoelectricity Pulsed laser deposition Pulsed lasers Silicon substrates Thin films Wurtzite Zinc oxide
Online-Zugang:	Volltext
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