Pressure-Driven Valence Increase and Metallization in Kondo Insulator Ce\(_3\)Bi\(_4\)Pt\(_3\)

We report the results of high pressure x-ray diffraction, x-ray absorption, and electrical transport measurements of Kondo insulator Ce\(_3\)Bi\(_4\)Pt\(_3\) up to 42 GPa, the highest pressure reached in the study of any Ce-based KI. We observe a smooth decrease in volume and movement toward interme...

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Veröffentlicht in:arXiv.org 2019-10
Hauptverfasser: Campbell, Daniel J, Brubaker, Zachary E, Connor Roncaioli, Saraf, Prathum, Xiao, Yuming, Chow, Paul, Kenney-Benson, Curtis, Popov, Dmitry, Zieve, Rena J, Jeffries, Jason R, Paglione, Johnpierre
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Sprache:eng
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Zusammenfassung:We report the results of high pressure x-ray diffraction, x-ray absorption, and electrical transport measurements of Kondo insulator Ce\(_3\)Bi\(_4\)Pt\(_3\) up to 42 GPa, the highest pressure reached in the study of any Ce-based KI. We observe a smooth decrease in volume and movement toward intermediate Ce valence with pressure, both of which point to increased electron correlations. Despite this, temperature-dependent resistance data show the suppression of the interaction-driven ambient pressure insulating ground state. We also discuss potential ramifications of these results for the predicted topological KI state.
ISSN:2331-8422
DOI:10.48550/arxiv.1907.09017