Physical characterizations of the sprayed ZrMo2O8 thin films

The objective of this work is to synthesize and evaluate the physical properties of the Zirconium-Molybdate-Oxide thin films via structural, optical and electrical measurements. The films were deposited on glass substrates using a chemical spray technique. The structural properties of obtained samples were analyzed by XRD technique and hexagonal ZrMo 2 O 8 structure was revealed in the films. The surface topography, as observed by scanning electron microscopy (SEM), shows the presence of randomly orientated spherical asperities ~ 2.5 μm in size. In addition, the optical parameters such as band gap energy value, refractive index and extinction coefficient were studied using spectrophotometry UV–VIS–NIR and spectroscopic ellipsometry. Finally, the dependences of electrical properties of ZrMo 2 O 8 thin film on temperature and frequency have been reported. The ac conductivity is investigated through the Jonscher model. The dc conductivity is thermally activated and the semiconductor-type behavior of the ZrMo 2 O 8 thin films is revealed. From the relaxation frequency, the activation energy value is about 1.29 eV.