Metal-Coated -Cut GaAs Coupled to Tapered Parallel-Plate Waveguide for Cherenkov-Phase-Matched Terahertz Detection: Influence of Crystal Thickness

The influence of crystal thickness of metal-coated -cut GaAs (M-G-M) on Cherenkov-phase-matched terahertz (THz) pulse detection was studied. The M-G-M detectors were utilized in conjunction with a metallic tapered parallel-plate waveguide (TPPWG). Polarization-sensitive measurements were carried out...

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Veröffentlicht in:Journal of infrared, millimeter and terahertz waves millimeter and terahertz waves, 2018-06, Vol.39 (6), p.514-520
Hauptverfasser: delos Santos, Ramon, Mag-usara, Valynn, Tuico, Anthony, Copa, Vernalyn, Salvador, Arnel, Yamamoto, Kohji, Somintac, Armando, Kurihara, Kazuyoshi, Kitahara, Hideaki, Tani, Masahiko, Estacio, Elmer
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Sprache:eng
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Zusammenfassung:The influence of crystal thickness of metal-coated -cut GaAs (M-G-M) on Cherenkov-phase-matched terahertz (THz) pulse detection was studied. The M-G-M detectors were utilized in conjunction with a metallic tapered parallel-plate waveguide (TPPWG). Polarization-sensitive measurements were carried out to exemplify the efficacy of GaAs in detecting transverse magnetic (TM)- and transverse electric (TE)-polarized THz waves. The reduction of GaAs’ thickness increased the THz amplitude spectra of the detected TM-polarized THz electro-optic (EO) signal due to enhanced electric field associated with a more tightly-focused and well-concentrated THz radiation on the thinner M-G-M. The higher-fluence THz beam coupled to the thinner M-G-M improved the integrated intensity of the detected THz amplitude spectrum. This trend was not observed for TE-polarized THz waves, wherein the integrated intensities were almost comparable. Nevertheless, good agreement of spectral line shapes of the superposed TM- and TE-polarized THz-EO signals with that of elliptically polarized THz-EO signal demonstrates excellent polarization-resolved detection capabilities of M-G-M via Cherenkov-phase-matched EO sampling technique.
ISSN:1866-6892
1866-6906
DOI:10.1007/s10762-018-0487-1