Layer-controlled synthesis of wafer-scale MoSe2 nanosheets for photodetector arrays

Despite huge efforts have been devoted to investigating ultrathin layers of two-dimensional (2D) transition-metal dichalcogenides (TMDs), their realistic applications in electronics and optoelectronics are hindered by limited scalability and uniformity of 2D thin layers. In this work, a two-step syn...

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Veröffentlicht in:Journal of materials science 2018-06, Vol.53 (11), p.8436-8444
Hauptverfasser: Dai, Tian-Jun, Fan, Xu-Dong, Ren, Yi-Xuan, Hou, Shuang, Zhang, Yi-Yu, Qian, Ling-Xuan, Li, Yan-Rong, Liu, Xing-Zhao
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Sprache:eng
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Zusammenfassung:Despite huge efforts have been devoted to investigating ultrathin layers of two-dimensional (2D) transition-metal dichalcogenides (TMDs), their realistic applications in electronics and optoelectronics are hindered by limited scalability and uniformity of 2D thin layers. In this work, a two-step synthesis method was adopted to produce wafer-scale molybdenum diselenide (MoSe 2 ) nanosheets. Molybdenum oxide (MoO 3 ) thin film was initially prepared via atomic layer deposition (ALD) and followed by a selenization process in chemical vapor deposition (CVD) tube furnace. MoSe 2 nanosheets with desired thickness can be obtained by tuning ALD cycles in preparing MoO 3 layers. The synthesized MoSe 2 films exhibited excellent layer controllability, homogeneity and wafer-scale uniformity. Few-layer structure of our MoSe 2 with a polycrystalline crystal structure was verified by means of Raman and transmission electron microscopy (TEM) measurements. Moreover, arrays of MoSe 2 -based photodetectors with different device dimension were fabricated and the photo-responses of the devices were studied. The device exhibited a fast photo-response time of 50 ms, a high on/off ratio of ~ 24 and a good photo-responsivity of 11.7 mA/W, and it is found that the effective illumination area was a critical factor for application. The work opens up an attractive approach to realize the application of wafer-scale 2D materials in integrated optoelectronic-systems.
ISSN:0022-2461
1573-4803
DOI:10.1007/s10853-018-2142-6