PROBE FOR SCANNING ION-CONDUCTANCE MICROSCOPY

The piezoelectric sensor for scanning probe microscope with a probe in the form of a glass micropipette forscanning ion-conductance microscopy has been made. Resonant frequency and Q-quality of the sensor have beenmeasured in the air and liquid environments. Nanotip has been created for spatial reso...

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Veröffentlicht in:Nauchno-tekhnicheskiĭ vestnik informat͡s︡ionnykh tekhnologiĭ, mekhaniki i optiki mekhaniki i optiki, 2010-07, Vol.10 (4)
Hauptverfasser: Golubok, A, Levichev, V, Matyzhonok, V, Stovpyaga, A
Format: Artikel
Sprache:rus
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Zusammenfassung:The piezoelectric sensor for scanning probe microscope with a probe in the form of a glass micropipette forscanning ion-conductance microscopy has been made. Resonant frequency and Q-quality of the sensor have beenmeasured in the air and liquid environments. Nanotip has been created for spatial resolution improvement of amicroprobe by means of the focused ion beam at a pipette butt end. Using a test grid, the spatial resolution of amicroprobe with nanotip is shown. The conclusion about an opportunity of using the sensor with a micropipettein the liquid environment with simultaneous activity in semi contact force mode and in a mode of measurementof ionic currents has been made.
ISSN:2226-1494
2500-0373