PROBE FOR SCANNING ION-CONDUCTANCE MICROSCOPY
The piezoelectric sensor for scanning probe microscope with a probe in the form of a glass micropipette forscanning ion-conductance microscopy has been made. Resonant frequency and Q-quality of the sensor have beenmeasured in the air and liquid environments. Nanotip has been created for spatial reso...
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Veröffentlicht in: | Nauchno-tekhnicheskiĭ vestnik informat͡s︡ionnykh tekhnologiĭ, mekhaniki i optiki mekhaniki i optiki, 2010-07, Vol.10 (4) |
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Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | rus |
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Zusammenfassung: | The piezoelectric sensor for scanning probe microscope with a probe in the form of a glass micropipette forscanning ion-conductance microscopy has been made. Resonant frequency and Q-quality of the sensor have beenmeasured in the air and liquid environments. Nanotip has been created for spatial resolution improvement of amicroprobe by means of the focused ion beam at a pipette butt end. Using a test grid, the spatial resolution of amicroprobe with nanotip is shown. The conclusion about an opportunity of using the sensor with a micropipettein the liquid environment with simultaneous activity in semi contact force mode and in a mode of measurementof ionic currents has been made. |
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ISSN: | 2226-1494 2500-0373 |