A Technique for Measuring the Resistance of an Electrical Breakdown Channel in Thin Dielectric Films
A technique for measuring the rate of change in the breakdown-channel resistance and estimating the true amplitude and duration of the breakdown current was developed. This technique is based on the dependence of the amplitude and frequency of oscillations of the measured current on the channel resi...
Gespeichert in:
| Veröffentlicht in: | Instruments and experimental techniques (New York) 2019-07, Vol.62 (3), p.329-336 |
|---|---|
| Hauptverfasser: | , |
| Format: | Artikel |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 336 |
|---|---|
| container_issue | 3 |
| container_start_page | 329 |
| container_title | Instruments and experimental techniques (New York) |
| container_volume | 62 |
| creator | Pakhotin, V. A. Sudar, N. T. |
| description | A technique for measuring the rate of change in the breakdown-channel resistance and estimating the true amplitude and duration of the breakdown current was developed. This technique is based on the dependence of the amplitude and frequency of oscillations of the measured current on the channel resistance. The resistance of the breakdown channel and the breakdown current in a polymer dielectric film were determined. |
| doi_str_mv | 10.1134/S0020441219020222 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_journals_2238023695</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>2238023695</sourcerecordid><originalsourceid>FETCH-LOGICAL-c316t-3c89d3f1977e5c5083f700da0638a5c93ba24efb389c5778774821524f99c4a33</originalsourceid><addsrcrecordid>eNp1UEtLAzEQDqJgrf4AbwHPq3nsbpJjra0KFUHreUmzEzd1m63JFvHfm6UFD-JlZuB7zMyH0CUl15Ty_OaVEEbynDKq0sAYO0IjWhKZcSrJMRoNcDbgp-gsxjUhRAkhRqie4CWYxrvPHWDbBfwEOu6C8--4bwC_QHSx194A7izWHs9aMH1wRrf4NoD-qLsvj6eN9h5a7DxeNqncOTjQ8Ny1m3iOTqxuI1wc-hi9zWfL6UO2eL5_nE4WmeG07DNupKq5pekyKExBJLeCkFqTkktdGMVXmuVgV1wqUwghhcglowXLrVIm15yP0dXedxu69E_sq3W3Cz6trBjjkjBeqiKx6J5lQhdjAFttg9vo8F1RUg1hVn_CTBq218TtkA2EX-f_RT9Px3Qw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2238023695</pqid></control><display><type>article</type><title>A Technique for Measuring the Resistance of an Electrical Breakdown Channel in Thin Dielectric Films</title><source>SpringerNature Journals</source><creator>Pakhotin, V. A. ; Sudar, N. T.</creator><creatorcontrib>Pakhotin, V. A. ; Sudar, N. T.</creatorcontrib><description>A technique for measuring the rate of change in the breakdown-channel resistance and estimating the true amplitude and duration of the breakdown current was developed. This technique is based on the dependence of the amplitude and frequency of oscillations of the measured current on the channel resistance. The resistance of the breakdown channel and the breakdown current in a polymer dielectric film were determined.</description><identifier>ISSN: 0020-4412</identifier><identifier>EISSN: 1608-3180</identifier><identifier>DOI: 10.1134/S0020441219020222</identifier><language>eng</language><publisher>Moscow: Pleiades Publishing</publisher><subject>Amplitudes ; Dependence ; Dielectric breakdown ; Electrical Engineering ; Electrical faults ; Electronics and Radio Engineering ; Measurement Science and Instrumentation ; Physical Chemistry ; Physics ; Physics and Astronomy ; Polymer films ; Thin films</subject><ispartof>Instruments and experimental techniques (New York), 2019-07, Vol.62 (3), p.329-336</ispartof><rights>Pleiades Publishing, Ltd. 2019</rights><rights>Copyright Springer Nature B.V. 2019</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c316t-3c89d3f1977e5c5083f700da0638a5c93ba24efb389c5778774821524f99c4a33</citedby><cites>FETCH-LOGICAL-c316t-3c89d3f1977e5c5083f700da0638a5c93ba24efb389c5778774821524f99c4a33</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1134/S0020441219020222$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1134/S0020441219020222$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>315,782,786,27931,27932,41495,42564,51326</link.rule.ids></links><search><creatorcontrib>Pakhotin, V. A.</creatorcontrib><creatorcontrib>Sudar, N. T.</creatorcontrib><title>A Technique for Measuring the Resistance of an Electrical Breakdown Channel in Thin Dielectric Films</title><title>Instruments and experimental techniques (New York)</title><addtitle>Instrum Exp Tech</addtitle><description>A technique for measuring the rate of change in the breakdown-channel resistance and estimating the true amplitude and duration of the breakdown current was developed. This technique is based on the dependence of the amplitude and frequency of oscillations of the measured current on the channel resistance. The resistance of the breakdown channel and the breakdown current in a polymer dielectric film were determined.</description><subject>Amplitudes</subject><subject>Dependence</subject><subject>Dielectric breakdown</subject><subject>Electrical Engineering</subject><subject>Electrical faults</subject><subject>Electronics and Radio Engineering</subject><subject>Measurement Science and Instrumentation</subject><subject>Physical Chemistry</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>Polymer films</subject><subject>Thin films</subject><issn>0020-4412</issn><issn>1608-3180</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNp1UEtLAzEQDqJgrf4AbwHPq3nsbpJjra0KFUHreUmzEzd1m63JFvHfm6UFD-JlZuB7zMyH0CUl15Ty_OaVEEbynDKq0sAYO0IjWhKZcSrJMRoNcDbgp-gsxjUhRAkhRqie4CWYxrvPHWDbBfwEOu6C8--4bwC_QHSx194A7izWHs9aMH1wRrf4NoD-qLsvj6eN9h5a7DxeNqncOTjQ8Ny1m3iOTqxuI1wc-hi9zWfL6UO2eL5_nE4WmeG07DNupKq5pekyKExBJLeCkFqTkktdGMVXmuVgV1wqUwghhcglowXLrVIm15yP0dXedxu69E_sq3W3Cz6trBjjkjBeqiKx6J5lQhdjAFttg9vo8F1RUg1hVn_CTBq218TtkA2EX-f_RT9Px3Qw</recordid><startdate>20190701</startdate><enddate>20190701</enddate><creator>Pakhotin, V. A.</creator><creator>Sudar, N. T.</creator><general>Pleiades Publishing</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20190701</creationdate><title>A Technique for Measuring the Resistance of an Electrical Breakdown Channel in Thin Dielectric Films</title><author>Pakhotin, V. A. ; Sudar, N. T.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c316t-3c89d3f1977e5c5083f700da0638a5c93ba24efb389c5778774821524f99c4a33</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Amplitudes</topic><topic>Dependence</topic><topic>Dielectric breakdown</topic><topic>Electrical Engineering</topic><topic>Electrical faults</topic><topic>Electronics and Radio Engineering</topic><topic>Measurement Science and Instrumentation</topic><topic>Physical Chemistry</topic><topic>Physics</topic><topic>Physics and Astronomy</topic><topic>Polymer films</topic><topic>Thin films</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Pakhotin, V. A.</creatorcontrib><creatorcontrib>Sudar, N. T.</creatorcontrib><collection>CrossRef</collection><jtitle>Instruments and experimental techniques (New York)</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Pakhotin, V. A.</au><au>Sudar, N. T.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>A Technique for Measuring the Resistance of an Electrical Breakdown Channel in Thin Dielectric Films</atitle><jtitle>Instruments and experimental techniques (New York)</jtitle><stitle>Instrum Exp Tech</stitle><date>2019-07-01</date><risdate>2019</risdate><volume>62</volume><issue>3</issue><spage>329</spage><epage>336</epage><pages>329-336</pages><issn>0020-4412</issn><eissn>1608-3180</eissn><abstract>A technique for measuring the rate of change in the breakdown-channel resistance and estimating the true amplitude and duration of the breakdown current was developed. This technique is based on the dependence of the amplitude and frequency of oscillations of the measured current on the channel resistance. The resistance of the breakdown channel and the breakdown current in a polymer dielectric film were determined.</abstract><cop>Moscow</cop><pub>Pleiades Publishing</pub><doi>10.1134/S0020441219020222</doi><tpages>8</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0020-4412 |
| ispartof | Instruments and experimental techniques (New York), 2019-07, Vol.62 (3), p.329-336 |
| issn | 0020-4412 1608-3180 |
| language | eng |
| recordid | cdi_proquest_journals_2238023695 |
| source | SpringerNature Journals |
| subjects | Amplitudes Dependence Dielectric breakdown Electrical Engineering Electrical faults Electronics and Radio Engineering Measurement Science and Instrumentation Physical Chemistry Physics Physics and Astronomy Polymer films Thin films |
| title | A Technique for Measuring the Resistance of an Electrical Breakdown Channel in Thin Dielectric Films |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-03T21%3A32%3A44IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=A%20Technique%20for%20Measuring%20the%20Resistance%20of%20an%20Electrical%20Breakdown%20Channel%20in%20Thin%20Dielectric%20Films&rft.jtitle=Instruments%20and%20experimental%20techniques%20(New%20York)&rft.au=Pakhotin,%20V.%20A.&rft.date=2019-07-01&rft.volume=62&rft.issue=3&rft.spage=329&rft.epage=336&rft.pages=329-336&rft.issn=0020-4412&rft.eissn=1608-3180&rft_id=info:doi/10.1134/S0020441219020222&rft_dat=%3Cproquest_cross%3E2238023695%3C/proquest_cross%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2238023695&rft_id=info:pmid/&rfr_iscdi=true |