A Technique for Measuring the Resistance of an Electrical Breakdown Channel in Thin Dielectric Films

A Technique for Measuring the Resistance of an Electrical Breakdown Channel in Thin Dielectric Films

A technique for measuring the rate of change in the breakdown-channel resistance and estimating the true amplitude and duration of the breakdown current was developed. This technique is based on the dependence of the amplitude and frequency of oscillations of the measured current on the channel resi...

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Veröffentlicht in:Instruments and experimental techniques (New York) 2019-07, Vol.62 (3), p.329-336
Hauptverfasser: Pakhotin, V. A., Sudar, N. T.
Format: Artikel
Sprache:eng
Schlagworte:
Amplitudes
Dependence
Dielectric breakdown
Electrical Engineering
Electrical faults
Electronics and Radio Engineering
Measurement Science and Instrumentation
Physical Chemistry
Physics
Physics and Astronomy
Polymer films
Thin films
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Beschreibung
Zusammenfassung:A technique for measuring the rate of change in the breakdown-channel resistance and estimating the true amplitude and duration of the breakdown current was developed. This technique is based on the dependence of the amplitude and frequency of oscillations of the measured current on the channel resistance. The resistance of the breakdown channel and the breakdown current in a polymer dielectric film were determined.
ISSN:0020-4412
1608-3180
DOI:10.1134/S0020441219020222