Multi-matrix opto-electronic system for measuring deformation of the millimeter range radiotelescope elements
A novel optical instrument is proposed and studied to measure the deformation of each connection point for a mirror, which includes 24 multi-matrix base units and can be used in millimeter-scale signal reflection systems. Experimental investigations reveal that the error of measurement is σ =8.7×10...
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| Veröffentlicht in: | Optoelectronics letters 2019-03, Vol.15 (2), p.144-146 |
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| container_end_page | 146 |
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| container_issue | 2 |
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| container_title | Optoelectronics letters |
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| creator | Li, Ren-pu Igor, Konyakhin Hoa, Tong Minh Zhou, Min |
| description | A novel optical instrument is proposed and studied to measure the deformation of each connection point for a mirror, which includes 24 multi-matrix base units and can be used in millimeter-scale signal reflection systems. Experimental investigations reveal that the error of measurement is
σ
=8.7×10
−3
mm at a distance of 5 500 mm, which allows to measure the linear deformation of a radiotelescope with the mirror diameter of 70 m. |
| doi_str_mv | 10.1007/s11801-019-8191-5 |
| format | Article |
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σ
=8.7×10
−3
mm at a distance of 5 500 mm, which allows to measure the linear deformation of a radiotelescope with the mirror diameter of 70 m.</description><identifier>ISSN: 1673-1905</identifier><identifier>EISSN: 1993-5013</identifier><identifier>DOI: 10.1007/s11801-019-8191-5</identifier><language>eng</language><publisher>Tianjin: Tianjin University of Technology</publisher><subject>Deformation ; Error analysis ; Lasers ; Optical Devices ; Optical instruments ; Optics ; Optoelectronics ; Photonics ; Physics ; Physics and Astronomy ; Signal reflection</subject><ispartof>Optoelectronics letters, 2019-03, Vol.15 (2), p.144-146</ispartof><rights>Tianjin University of Technology and Springer-Verlag GmbH Germany, part of Springer Nature 2019</rights><rights>Copyright Springer Nature B.V. 2019</rights><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c316t-c89a3f938ba02aee92e0f2992b23c6df77d57786ccd8a1c892dfbcd3dea2ae03</citedby><cites>FETCH-LOGICAL-c316t-c89a3f938ba02aee92e0f2992b23c6df77d57786ccd8a1c892dfbcd3dea2ae03</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://link.springer.com/content/pdf/10.1007/s11801-019-8191-5$$EPDF$$P50$$Gspringer$$H</linktopdf><linktohtml>$$Uhttps://link.springer.com/10.1007/s11801-019-8191-5$$EHTML$$P50$$Gspringer$$H</linktohtml><link.rule.ids>314,778,782,27911,27912,41475,42544,51306</link.rule.ids></links><search><creatorcontrib>Li, Ren-pu</creatorcontrib><creatorcontrib>Igor, Konyakhin</creatorcontrib><creatorcontrib>Hoa, Tong Minh</creatorcontrib><creatorcontrib>Zhou, Min</creatorcontrib><title>Multi-matrix opto-electronic system for measuring deformation of the millimeter range radiotelescope elements</title><title>Optoelectronics letters</title><addtitle>Optoelectron. Lett</addtitle><description>A novel optical instrument is proposed and studied to measure the deformation of each connection point for a mirror, which includes 24 multi-matrix base units and can be used in millimeter-scale signal reflection systems. Experimental investigations reveal that the error of measurement is
σ
=8.7×10
−3
mm at a distance of 5 500 mm, which allows to measure the linear deformation of a radiotelescope with the mirror diameter of 70 m.</description><subject>Deformation</subject><subject>Error analysis</subject><subject>Lasers</subject><subject>Optical Devices</subject><subject>Optical instruments</subject><subject>Optics</subject><subject>Optoelectronics</subject><subject>Photonics</subject><subject>Physics</subject><subject>Physics and Astronomy</subject><subject>Signal reflection</subject><issn>1673-1905</issn><issn>1993-5013</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><recordid>eNp1kEtLAzEUhQdRsNT-AHcB19E8OjPJUoovqLjpPqSZm5oymYxJBuy_N2UEV97FfcA558JXVbeU3FNC2odEqSAUEyqxoJLi-qJaUCk5rgnll2VvWo6pJPV1tUrpSEpx1oq1XFT-feqzw17n6L5RGHPA0IPJMQzOoHRKGTyyISIPOk3RDQfUQbmLwYUBBYvyJyDv-t55yBBR1MMBSu9cyCUpmTACKouHIaeb6srqPsHqdy6r3fPTbvOKtx8vb5vHLTacNhkbITW3kou9JkwDSAbEMinZnnHTdLZtu7ptRWNMJzQtatbZvel4B7rICV9Wd3PsGMPXBCmrY5jiUD4qxki9bmjLRVHRWWViSCmCVWN0XseTokSduaqZqypc1ZmrqouHzZ40nllA_Ev-3_QDuYp-JA</recordid><startdate>20190301</startdate><enddate>20190301</enddate><creator>Li, Ren-pu</creator><creator>Igor, Konyakhin</creator><creator>Hoa, Tong Minh</creator><creator>Zhou, Min</creator><general>Tianjin University of Technology</general><general>Springer Nature B.V</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20190301</creationdate><title>Multi-matrix opto-electronic system for measuring deformation of the millimeter range radiotelescope elements</title><author>Li, Ren-pu ; Igor, Konyakhin ; Hoa, Tong Minh ; Zhou, Min</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c316t-c89a3f938ba02aee92e0f2992b23c6df77d57786ccd8a1c892dfbcd3dea2ae03</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Deformation</topic><topic>Error analysis</topic><topic>Lasers</topic><topic>Optical Devices</topic><topic>Optical instruments</topic><topic>Optics</topic><topic>Optoelectronics</topic><topic>Photonics</topic><topic>Physics</topic><topic>Physics and Astronomy</topic><topic>Signal reflection</topic><toplevel>online_resources</toplevel><creatorcontrib>Li, Ren-pu</creatorcontrib><creatorcontrib>Igor, Konyakhin</creatorcontrib><creatorcontrib>Hoa, Tong Minh</creatorcontrib><creatorcontrib>Zhou, Min</creatorcontrib><collection>CrossRef</collection><jtitle>Optoelectronics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Li, Ren-pu</au><au>Igor, Konyakhin</au><au>Hoa, Tong Minh</au><au>Zhou, Min</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Multi-matrix opto-electronic system for measuring deformation of the millimeter range radiotelescope elements</atitle><jtitle>Optoelectronics letters</jtitle><stitle>Optoelectron. Lett</stitle><date>2019-03-01</date><risdate>2019</risdate><volume>15</volume><issue>2</issue><spage>144</spage><epage>146</epage><pages>144-146</pages><issn>1673-1905</issn><eissn>1993-5013</eissn><abstract>A novel optical instrument is proposed and studied to measure the deformation of each connection point for a mirror, which includes 24 multi-matrix base units and can be used in millimeter-scale signal reflection systems. Experimental investigations reveal that the error of measurement is
σ
=8.7×10
−3
mm at a distance of 5 500 mm, which allows to measure the linear deformation of a radiotelescope with the mirror diameter of 70 m.</abstract><cop>Tianjin</cop><pub>Tianjin University of Technology</pub><doi>10.1007/s11801-019-8191-5</doi><tpages>3</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 1673-1905 |
| ispartof | Optoelectronics letters, 2019-03, Vol.15 (2), p.144-146 |
| issn | 1673-1905 1993-5013 |
| language | eng |
| recordid | cdi_proquest_journals_2205461738 |
| source | Springer Nature - Complete Springer Journals; Alma/SFX Local Collection |
| subjects | Deformation Error analysis Lasers Optical Devices Optical instruments Optics Optoelectronics Photonics Physics Physics and Astronomy Signal reflection |
| title | Multi-matrix opto-electronic system for measuring deformation of the millimeter range radiotelescope elements |
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