Comparison of electron backscatter and X‐ray diffraction techniques for measuring dislocation density in Zircaloy‐2

Two methods for measuring dislocation density were applied to a series of plastically deformed tensile samples of Zircaloy‐2. Samples subjected to plastic strains ranging from 4 to 17% along a variety of loading paths were characterized using both electron backscatter diffraction (EBSD) and synchrotron X‐ray line profile analysis (LPA). It was found that the EBSD‐based method gave results which were similar in magnitude to those obtained by LPA and followed a similar trend with increasing plastic strain. The effects of microscope parameters and post‐processing of the EBSD data on dislocation density measurements are also discussed. The typical method for estimating uncertainty in dislocation density measured via EBSD was shown to be overly conservative, and a more realistic method of determining uncertainty is presented as an alternative. Dislocation densities of Zircaloy‐2 tensile samples are measured using two diffraction‐based techniques. The relative sensitivities of the techniques to dislocations produced during cold work are compared.