Effect of copper doping on the crystallization behavior of TiSbTe for fast-speed phase change memory
•The enhanced thermal stability is high enough for application.•SET/RESET operation of 5 ns is realized with large sensing margin.•The role of Cu in suppressing crystallisation was proved by XRD and TEM results. In this study, Ti-Sb-Te (TST) alloy doped with Cu has been proposed to enhance the phase...
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Veröffentlicht in: | Materials letters 2019-04, Vol.241, p.148-151 |
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Hauptverfasser: | , , , , , , , , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | •The enhanced thermal stability is high enough for application.•SET/RESET operation of 5 ns is realized with large sensing margin.•The role of Cu in suppressing crystallisation was proved by XRD and TEM results.
In this study, Ti-Sb-Te (TST) alloy doped with Cu has been proposed to enhance the phase change and electrical properties of TST. The formation of Cu-Te bond was suggest to be responsible for the improved thermal stability of the Cu0.28(Ti0.09Sb0.38Te0.53)0.72 (Cu0.28TST) film. Cu0.28TST-based phase change memory cell can be triggered by a 5 ns electric pulse. Such fast speed was ascribed to its growth-dominated crystallization mechanism and the precipitation of Sb in the crystallization process. Furthermore, an endurance cycles up to 105 could be achieved in the memory cell. |
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ISSN: | 0167-577X 1873-4979 |
DOI: | 10.1016/j.matlet.2019.01.065 |