Effect of copper doping on the crystallization behavior of TiSbTe for fast-speed phase change memory

•The enhanced thermal stability is high enough for application.•SET/RESET operation of 5 ns is realized with large sensing margin.•The role of Cu in suppressing crystallisation was proved by XRD and TEM results. In this study, Ti-Sb-Te (TST) alloy doped with Cu has been proposed to enhance the phase...

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Veröffentlicht in:Materials letters 2019-04, Vol.241, p.148-151
Hauptverfasser: Zheng, Qianqian, Guo, Tianqi, Chen, Liangliang, Song, Sannian, Zhang, Xin, Yu, Wenlei, Zhu, Xiuwei, Shao, Hehong, Zheng, Wanting, zhang, Juan
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Sprache:eng
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Zusammenfassung:•The enhanced thermal stability is high enough for application.•SET/RESET operation of 5 ns is realized with large sensing margin.•The role of Cu in suppressing crystallisation was proved by XRD and TEM results. In this study, Ti-Sb-Te (TST) alloy doped with Cu has been proposed to enhance the phase change and electrical properties of TST. The formation of Cu-Te bond was suggest to be responsible for the improved thermal stability of the Cu0.28(Ti0.09Sb0.38Te0.53)0.72 (Cu0.28TST) film. Cu0.28TST-based phase change memory cell can be triggered by a 5 ns electric pulse. Such fast speed was ascribed to its growth-dominated crystallization mechanism and the precipitation of Sb in the crystallization process. Furthermore, an endurance cycles up to 105 could be achieved in the memory cell.
ISSN:0167-577X
1873-4979
DOI:10.1016/j.matlet.2019.01.065