Probing the Microstructure of Methylammonium Lead Iodide Perovskite Solar Cells

The microstructure of absorber layers is pivotally important for all thin‐film solar technologies. Using electron backscattered diffraction (EBSD), the crystal orientation in methylammonium lead iodide thin films with submicrometer resolution is reported. For the vast majority of (110) oriented grains, the c‐axis of the perovskite unit cell is oriented in‐plane. Although some adjacent grains exhibit the same in‐plane horizontal orientation of the c‐axis, no universal horizontal orientation of the c‐axis within the sample plane exists. The (110) crystal orientation correlates with an in‐plane orientation of the ferroelectric polarization as investigated by vertical and lateral piezoresponse force microscopy (PFM). The individual grains with different crystal orientations that exhibit different ferroelectric patterns and surface potentials are identified. The strong correlation between crystal orientation and ferroelectric polarization allows conclusions to be drawn about the microstructure from PFM measurements and, likewise, the ferroelectric polarization to be derived from crystallographic observations by EBSD. The spatially resolved correlation of electron backscattered diffraction and piezoresponse force microscopy data provides insight into the microstructure of methylammonium lead iodide thin films that are commonly incorporated into perovskite solar cells.