Electrical transport effects in YBCO/LSMO bilayer junctions

The electrical transport effects in interfaces of high TC superconducting and ferromagnetic thin film bilayer structures (YBa2Cu3Ox/La0.67Sr0.33MnO3 junctions with areas of ∼0.2 × 10−4 cm2 and ∼1.21 × 10−4 cm2) were investigated in view of the importance of such structures for oxide electronics and spintronics applications. In some structures the junction resistance Rj, measured by a standard four probe method at T TC were discussed as well. •Electrical transport across HTS YBCO/FM LSMO junctions is studied by 4-probe method.•Measured junction resistance Rj at T