Statistical Inference Method for Liner Impedance Eduction with a Shear Grazing Flow

This paper presents a statistical inference method for impedance eduction in a flow-duct facility. The acoustic impedance is recast into a random variable, and Bayes’s theorem is used to obtain the posterior probability density function of both its real and imaginary parts, thus expressing the knowl...

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Veröffentlicht in:AIAA journal 2019-03, Vol.57 (3), p.1055-1065
Hauptverfasser: Roncen, R, Méry, F, Piot, E, Simon, F
Format: Artikel
Sprache:eng
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Zusammenfassung:This paper presents a statistical inference method for impedance eduction in a flow-duct facility. The acoustic impedance is recast into a random variable, and Bayes’s theorem is used to obtain the posterior probability density function of both its real and imaginary parts, thus expressing the knowledge/uncertainty one has on the impedance value, given a certain experimental data uncertainty. An evolutionary Markov chain Monte Carlo technique is selected to explore the probability space, and a surrogate model based on the method of snapshots is employed to speed up the calculations. The linearized Euler equations are solved using a two-dimensional discontinuous Galerkin scheme, accounting for the presence of a grazing flow. The inference process is first validated on published NASA Grazing Incidence Tube results, in which acoustic-pressure measurements on the wall opposite the liner are used as inputs. Then, the same procedure is applied to educe the impedance of a conventional single degree-of-freedom liner in the ONERA–The French Aerospace Lab B2A acoustic bench, in which a laser Doppler velocimetry (LDV) technique is used to measure the two components of the acoustic-velocity fields above the liner. The primary conclusion of the study is that the Bayesian inference method allows for consistent impedance eductions, as compared to a classical deterministic eduction approach, for both microphone and LDV measurements. Furthermore, it yields the credibility intervals of the identified impedance, which represent the uncertainty on the identified impedance values, given an uncertain measurement. The identified parameters are less correlated using an LDV-based inference than a microphone-based inference, which might be due to the more limited number of data.
ISSN:0001-1452
1533-385X
DOI:10.2514/1.J057559