Investigation and Modeling of Large Barkhausen Jumps Dynamics in Low-Power Fluxgate Magnetometers
Large Barkhausen jumps occur in low-power fluxgates output and seriously affect the signal fidelity and therefore the magnetometer functionality. In this paper, we investigate the occurrence of DC jumps in two types of fluxgates, parallel and orthogonal. We present a new model for the jumps phenomen...
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| Veröffentlicht in: | IEEE sensors journal 2019-03, Vol.19 (6), p.2105-2112 |
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| creator | Weiss, Eyal Alimi, Roger Ivry, Amir Fisher, Elad |
| description | Large Barkhausen jumps occur in low-power fluxgates output and seriously affect the signal fidelity and therefore the magnetometer functionality. In this paper, we investigate the occurrence of DC jumps in two types of fluxgates, parallel and orthogonal. We present a new model for the jumps phenomenon. This model is based on the reversal dynamics of magnetic domains in the core metallurgical super-structures. We expand the model to explain how and why the jumps subside in time. We show that although the jumps rate decays exponentially in time, the process never completely stops. The understanding of DC jumps dynamics may be utilized in research and development of low-power magnetic sensors. It may be used to characterize and standardize the quality of magnetic sensors cores and used to screen faulty cores that exhibit exceptionally high jump rate that may affect signal fidelity. Mitigating the jumps in both parallel and orthogonal low-power fluxgates is crucial for low-noise magnetic measurement systems. |
| doi_str_mv | 10.1109/JSEN.2018.2885779 |
| format | Article |
| fullrecord | <record><control><sourceid>proquest_RIE</sourceid><recordid>TN_cdi_proquest_journals_2184577785</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>8570767</ieee_id><sourcerecordid>2184577785</sourcerecordid><originalsourceid>FETCH-LOGICAL-c293t-17a0e9a8ccbc8ca3af7b44c158c10de68149d55c6eb82c7bda4c1e131620a1be3</originalsourceid><addsrcrecordid>eNo9kM1OwzAQhC0EEqXwAIiLJc4pdv7sHKG00CoFJEDiZjnOJqS0drETSt8eR6047Uo7M7v7IXRJyYhSkt3MXydPo5BQPgo5TxjLjtCAJgkPKIv5cd9HJIgj9nGKzpxbEkIzlrABkjP9A65tatk2RmOpS7wwJawaXWNT4VzaGvCdtF-fsnOg8bxbbxy-32m5bpTDjca52QYvZgsWT1fdr88BvJC1htasoQXrztFJJVcOLg51iN6nk7fxY5A_P8zGt3mgwixq_Z2SQCa5UoXiSkayYkUcK5pwRUkJKadxViaJSqHgoWJFKf0QaETTkEhaQDRE1_vcjTXfnf9JLE1ntV8pQspjz4TxxKvoXqWscc5CJTa2WUu7E5SInqToSYqepDiQ9J6rvacBgH-9nxGWsugPgPtw7A</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2184577785</pqid></control><display><type>article</type><title>Investigation and Modeling of Large Barkhausen Jumps Dynamics in Low-Power Fluxgate Magnetometers</title><source>IEEE Electronic Library (IEL)</source><creator>Weiss, Eyal ; Alimi, Roger ; Ivry, Amir ; Fisher, Elad</creator><creatorcontrib>Weiss, Eyal ; Alimi, Roger ; Ivry, Amir ; Fisher, Elad</creatorcontrib><description>Large Barkhausen jumps occur in low-power fluxgates output and seriously affect the signal fidelity and therefore the magnetometer functionality. In this paper, we investigate the occurrence of DC jumps in two types of fluxgates, parallel and orthogonal. We present a new model for the jumps phenomenon. This model is based on the reversal dynamics of magnetic domains in the core metallurgical super-structures. We expand the model to explain how and why the jumps subside in time. We show that although the jumps rate decays exponentially in time, the process never completely stops. The understanding of DC jumps dynamics may be utilized in research and development of low-power magnetic sensors. It may be used to characterize and standardize the quality of magnetic sensors cores and used to screen faulty cores that exhibit exceptionally high jump rate that may affect signal fidelity. Mitigating the jumps in both parallel and orthogonal low-power fluxgates is crucial for low-noise magnetic measurement systems.</description><identifier>ISSN: 1530-437X</identifier><identifier>EISSN: 1558-1748</identifier><identifier>DOI: 10.1109/JSEN.2018.2885779</identifier><identifier>CODEN: ISJEAZ</identifier><language>eng</language><publisher>New York: IEEE</publisher><subject>Barkhausen effect ; Barkhausen noise ; DC jumps ; Decay rate ; detection algorithm ; Dynamic structural analysis ; Fluxgate magnetometers ; low power ; Magnetic cores ; Magnetic domains ; Magnetic measurement ; Magnetic noise ; Magnetic sensors ; Magnetometers ; Metallurgy ; Noise measurement ; R&D ; Research & development ; Sensor phenomena and characterization ; Sensors ; signal fidelity ; Systems (metallurgical)</subject><ispartof>IEEE sensors journal, 2019-03, Vol.19 (6), p.2105-2112</ispartof><rights>Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2019</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c293t-17a0e9a8ccbc8ca3af7b44c158c10de68149d55c6eb82c7bda4c1e131620a1be3</citedby><cites>FETCH-LOGICAL-c293t-17a0e9a8ccbc8ca3af7b44c158c10de68149d55c6eb82c7bda4c1e131620a1be3</cites><orcidid>0000-0001-9511-1472 ; 0000-0002-9043-7040 ; 0000-0003-4914-7479 ; 0000-0003-0731-0303</orcidid></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/8570767$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>314,776,780,792,27903,27904,54737</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/8570767$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Weiss, Eyal</creatorcontrib><creatorcontrib>Alimi, Roger</creatorcontrib><creatorcontrib>Ivry, Amir</creatorcontrib><creatorcontrib>Fisher, Elad</creatorcontrib><title>Investigation and Modeling of Large Barkhausen Jumps Dynamics in Low-Power Fluxgate Magnetometers</title><title>IEEE sensors journal</title><addtitle>JSEN</addtitle><description>Large Barkhausen jumps occur in low-power fluxgates output and seriously affect the signal fidelity and therefore the magnetometer functionality. In this paper, we investigate the occurrence of DC jumps in two types of fluxgates, parallel and orthogonal. We present a new model for the jumps phenomenon. This model is based on the reversal dynamics of magnetic domains in the core metallurgical super-structures. We expand the model to explain how and why the jumps subside in time. We show that although the jumps rate decays exponentially in time, the process never completely stops. The understanding of DC jumps dynamics may be utilized in research and development of low-power magnetic sensors. It may be used to characterize and standardize the quality of magnetic sensors cores and used to screen faulty cores that exhibit exceptionally high jump rate that may affect signal fidelity. Mitigating the jumps in both parallel and orthogonal low-power fluxgates is crucial for low-noise magnetic measurement systems.</description><subject>Barkhausen effect</subject><subject>Barkhausen noise</subject><subject>DC jumps</subject><subject>Decay rate</subject><subject>detection algorithm</subject><subject>Dynamic structural analysis</subject><subject>Fluxgate magnetometers</subject><subject>low power</subject><subject>Magnetic cores</subject><subject>Magnetic domains</subject><subject>Magnetic measurement</subject><subject>Magnetic noise</subject><subject>Magnetic sensors</subject><subject>Magnetometers</subject><subject>Metallurgy</subject><subject>Noise measurement</subject><subject>R&D</subject><subject>Research & development</subject><subject>Sensor phenomena and characterization</subject><subject>Sensors</subject><subject>signal fidelity</subject><subject>Systems (metallurgical)</subject><issn>1530-437X</issn><issn>1558-1748</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2019</creationdate><recordtype>article</recordtype><sourceid>RIE</sourceid><recordid>eNo9kM1OwzAQhC0EEqXwAIiLJc4pdv7sHKG00CoFJEDiZjnOJqS0drETSt8eR6047Uo7M7v7IXRJyYhSkt3MXydPo5BQPgo5TxjLjtCAJgkPKIv5cd9HJIgj9nGKzpxbEkIzlrABkjP9A65tatk2RmOpS7wwJawaXWNT4VzaGvCdtF-fsnOg8bxbbxy-32m5bpTDjca52QYvZgsWT1fdr88BvJC1htasoQXrztFJJVcOLg51iN6nk7fxY5A_P8zGt3mgwixq_Z2SQCa5UoXiSkayYkUcK5pwRUkJKadxViaJSqHgoWJFKf0QaETTkEhaQDRE1_vcjTXfnf9JLE1ntV8pQspjz4TxxKvoXqWscc5CJTa2WUu7E5SInqToSYqepDiQ9J6rvacBgH-9nxGWsugPgPtw7A</recordid><startdate>20190315</startdate><enddate>20190315</enddate><creator>Weiss, Eyal</creator><creator>Alimi, Roger</creator><creator>Ivry, Amir</creator><creator>Fisher, Elad</creator><general>IEEE</general><general>The Institute of Electrical and Electronics Engineers, Inc. (IEEE)</general><scope>97E</scope><scope>RIA</scope><scope>RIE</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope><orcidid>https://orcid.org/0000-0001-9511-1472</orcidid><orcidid>https://orcid.org/0000-0002-9043-7040</orcidid><orcidid>https://orcid.org/0000-0003-4914-7479</orcidid><orcidid>https://orcid.org/0000-0003-0731-0303</orcidid></search><sort><creationdate>20190315</creationdate><title>Investigation and Modeling of Large Barkhausen Jumps Dynamics in Low-Power Fluxgate Magnetometers</title><author>Weiss, Eyal ; Alimi, Roger ; Ivry, Amir ; Fisher, Elad</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c293t-17a0e9a8ccbc8ca3af7b44c158c10de68149d55c6eb82c7bda4c1e131620a1be3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2019</creationdate><topic>Barkhausen effect</topic><topic>Barkhausen noise</topic><topic>DC jumps</topic><topic>Decay rate</topic><topic>detection algorithm</topic><topic>Dynamic structural analysis</topic><topic>Fluxgate magnetometers</topic><topic>low power</topic><topic>Magnetic cores</topic><topic>Magnetic domains</topic><topic>Magnetic measurement</topic><topic>Magnetic noise</topic><topic>Magnetic sensors</topic><topic>Magnetometers</topic><topic>Metallurgy</topic><topic>Noise measurement</topic><topic>R&D</topic><topic>Research & development</topic><topic>Sensor phenomena and characterization</topic><topic>Sensors</topic><topic>signal fidelity</topic><topic>Systems (metallurgical)</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Weiss, Eyal</creatorcontrib><creatorcontrib>Alimi, Roger</creatorcontrib><creatorcontrib>Ivry, Amir</creatorcontrib><creatorcontrib>Fisher, Elad</creatorcontrib><collection>IEEE All-Society Periodicals Package (ASPP) 2005-present</collection><collection>IEEE All-Society Periodicals Package (ASPP) 1998-Present</collection><collection>IEEE Electronic Library (IEL)</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>IEEE sensors journal</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Weiss, Eyal</au><au>Alimi, Roger</au><au>Ivry, Amir</au><au>Fisher, Elad</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Investigation and Modeling of Large Barkhausen Jumps Dynamics in Low-Power Fluxgate Magnetometers</atitle><jtitle>IEEE sensors journal</jtitle><stitle>JSEN</stitle><date>2019-03-15</date><risdate>2019</risdate><volume>19</volume><issue>6</issue><spage>2105</spage><epage>2112</epage><pages>2105-2112</pages><issn>1530-437X</issn><eissn>1558-1748</eissn><coden>ISJEAZ</coden><abstract>Large Barkhausen jumps occur in low-power fluxgates output and seriously affect the signal fidelity and therefore the magnetometer functionality. In this paper, we investigate the occurrence of DC jumps in two types of fluxgates, parallel and orthogonal. We present a new model for the jumps phenomenon. This model is based on the reversal dynamics of magnetic domains in the core metallurgical super-structures. We expand the model to explain how and why the jumps subside in time. We show that although the jumps rate decays exponentially in time, the process never completely stops. The understanding of DC jumps dynamics may be utilized in research and development of low-power magnetic sensors. It may be used to characterize and standardize the quality of magnetic sensors cores and used to screen faulty cores that exhibit exceptionally high jump rate that may affect signal fidelity. Mitigating the jumps in both parallel and orthogonal low-power fluxgates is crucial for low-noise magnetic measurement systems.</abstract><cop>New York</cop><pub>IEEE</pub><doi>10.1109/JSEN.2018.2885779</doi><tpages>8</tpages><orcidid>https://orcid.org/0000-0001-9511-1472</orcidid><orcidid>https://orcid.org/0000-0002-9043-7040</orcidid><orcidid>https://orcid.org/0000-0003-4914-7479</orcidid><orcidid>https://orcid.org/0000-0003-0731-0303</orcidid></addata></record> |
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| subjects | Barkhausen effect Barkhausen noise DC jumps Decay rate detection algorithm Dynamic structural analysis Fluxgate magnetometers low power Magnetic cores Magnetic domains Magnetic measurement Magnetic noise Magnetic sensors Magnetometers Metallurgy Noise measurement R&D Research & development Sensor phenomena and characterization Sensors signal fidelity Systems (metallurgical) |
| title | Investigation and Modeling of Large Barkhausen Jumps Dynamics in Low-Power Fluxgate Magnetometers |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-23T08%3A41%3A34IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_RIE&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Investigation%20and%20Modeling%20of%20Large%20Barkhausen%20Jumps%20Dynamics%20in%20Low-Power%20Fluxgate%20Magnetometers&rft.jtitle=IEEE%20sensors%20journal&rft.au=Weiss,%20Eyal&rft.date=2019-03-15&rft.volume=19&rft.issue=6&rft.spage=2105&rft.epage=2112&rft.pages=2105-2112&rft.issn=1530-437X&rft.eissn=1558-1748&rft.coden=ISJEAZ&rft_id=info:doi/10.1109/JSEN.2018.2885779&rft_dat=%3Cproquest_RIE%3E2184577785%3C/proquest_RIE%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_pqid=2184577785&rft_id=info:pmid/&rft_ieee_id=8570767&rfr_iscdi=true |