Dielectric Properties of Fine-Grained Barium Titanate Based X7R Materials
The next generations of multilayer ceramic capacitors are expected to have active ceramic layer thicknesses of 3 μm or less. To retain a reliable ceramic device, it is advantageous to engineer a uniform and fine‐grained microstructure. In this study, a dense ceramic (>96% of theoretical) with fin...
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Veröffentlicht in: | Journal of the American Ceramic Society 1999-10, Vol.82 (10), p.2677-2682 |
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Hauptverfasser: | , |
Format: | Artikel |
Sprache: | eng |
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Online-Zugang: | Volltext |
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Zusammenfassung: | The next generations of multilayer ceramic capacitors are expected to have active ceramic layer thicknesses of 3 μm or less. To retain a reliable ceramic device, it is advantageous to engineer a uniform and fine‐grained microstructure. In this study, a dense ceramic (>96% of theoretical) with fine‐grained size ( |
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ISSN: | 0002-7820 1551-2916 |
DOI: | 10.1111/j.1151-2916.1999.tb02141.x |