Dielectric Properties of Fine-Grained Barium Titanate Based X7R Materials

The next generations of multilayer ceramic capacitors are expected to have active ceramic layer thicknesses of 3 μm or less. To retain a reliable ceramic device, it is advantageous to engineer a uniform and fine‐grained microstructure. In this study, a dense ceramic (>96% of theoretical) with fin...

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Veröffentlicht in:Journal of the American Ceramic Society 1999-10, Vol.82 (10), p.2677-2682
Hauptverfasser: Wang, Sea-Fue, Dayton, Gordon O.
Format: Artikel
Sprache:eng
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Zusammenfassung:The next generations of multilayer ceramic capacitors are expected to have active ceramic layer thicknesses of 3 μm or less. To retain a reliable ceramic device, it is advantageous to engineer a uniform and fine‐grained microstructure. In this study, a dense ceramic (>96% of theoretical) with fine‐grained size (
ISSN:0002-7820
1551-2916
DOI:10.1111/j.1151-2916.1999.tb02141.x