Quantitative Diffuse Reflectance and Diffuse Transmittance Infrared Spectroscopy of Surface-Derivatized Silica Powders

Quantitative Diffuse Reflectance and Diffuse Transmittance Infrared Spectroscopy of Surface-Derivatized Silica Powders

Absolute diffuse reflectance and transmittance FT-IR spectra of optically thin layers of surface-derivatized silica powders are measured using a photopyroelectric detector placed in direct contact with the sample.

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Veröffentlicht in:Analytical chemistry (Washington) 1994-07, Vol.66 (14), p.2260-2266
Hauptverfasser: Boroumand, Farnaz, van den Bergh, Hubert, Moser, Jacques E
Format: Artikel
Sprache:eng
Schlagworte:
Analytical chemistry
Chemistry
Exact sciences and technology
Scientific imaging
Sensors
Spectrometric and optical methods
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Beschreibung
Zusammenfassung:Absolute diffuse reflectance and transmittance FT-IR spectra of optically thin layers of surface-derivatized silica powders are measured using a photopyroelectric detector placed in direct contact with the sample.
ISSN:0003-2700
1520-6882
DOI:10.1021/ac00086a010