Molecular Imaging Secondary Ion Mass Spectrometry for the Characterization of Patterned Self-Assembled Monolayers on Silver and Gold

A study used secondary ion mass spectrometry (SIMS) to characterize methods of producing micrometer spatial scale patterns of two chemically distinct monolayers on silver and gold surfaces. SIMS allowed unambiguous confirmation of the correct fabrication of a molecular pattern with micrometer spatia...

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Veröffentlicht in:Analytical chemistry (Washington) 1994-07, Vol.66 (13), p.2170-2174
Hauptverfasser: Gillen, Greg, Bennett, Joe, Tarlov, Michael J., Burgess, Donald R. F.
Format: Artikel
Sprache:eng
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Zusammenfassung:A study used secondary ion mass spectrometry (SIMS) to characterize methods of producing micrometer spatial scale patterns of two chemically distinct monolayers on silver and gold surfaces. SIMS allowed unambiguous confirmation of the correct fabrication of a molecular pattern with micrometer spatial scale resolution.
ISSN:0003-2700
1520-6882
DOI:10.1021/ac00085a036