Depth Profiling of Functionalized Silane Films on Quartz and Silicon Substrates and of Urease Immobilized on Such Films by Angle-Resolved X-ray Photoelectron Spectroscopy

Depth Profiling of Functionalized Silane Films on Quartz and Silicon Substrates and of Urease Immobilized on Such Films by Angle-Resolved X-ray Photoelectron Spectroscopy

A study evaluated the thickness of nonfunctional C18, omega-carboxypentadecyl, and omega-aminododecanoylaminopropyl silane films covalently anchored on quartz and silicon substrates by angle-resolved X-ray photoelectron spectroscopy.

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Veröffentlicht in:Analytical chemistry (Washington) 1995-08, Vol.67 (15), p.2625-2634
Hauptverfasser: Kallury, Krishna M. R, Brennan, John D, Krull, Ulrich J
Format: Artikel
Sprache:eng
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Chemistry
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Physics
Scientific imaging
Structure and morphology
thickness
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
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container_issue 15
container_start_page 2625
container_title Analytical chemistry (Washington)
container_volume 67
creator Kallury, Krishna M. R
Brennan, John D
Krull, Ulrich J
description A study evaluated the thickness of nonfunctional C18, omega-carboxypentadecyl, and omega-aminododecanoylaminopropyl silane films covalently anchored on quartz and silicon substrates by angle-resolved X-ray photoelectron spectroscopy.
doi_str_mv 10.1021/ac00111a021
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source ACS Publications
subjects Chemistry
Condensed matter: structure, mechanical and thermal properties
Exact sciences and technology
Physics
Scientific imaging
Structure and morphology
thickness
Surfaces and interfaces
thin films and whiskers (structure and nonelectronic properties)
Thin film structure and morphology
title Depth Profiling of Functionalized Silane Films on Quartz and Silicon Substrates and of Urease Immobilized on Such Films by Angle-Resolved X-ray Photoelectron Spectroscopy
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