Depth Profiling of Functionalized Silane Films on Quartz and Silicon Substrates and of Urease Immobilized on Such Films by Angle-Resolved X-ray Photoelectron Spectroscopy

A study evaluated the thickness of nonfunctional C18, omega-carboxypentadecyl, and omega-aminododecanoylaminopropyl silane films covalently anchored on quartz and silicon substrates by angle-resolved X-ray photoelectron spectroscopy.

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Bibliographische Detailangaben
Veröffentlicht in:	Analytical chemistry (Washington) 1995-08, Vol.67 (15), p.2625-2634
Hauptverfasser:	Kallury, Krishna M. R, Brennan, John D, Krull, Ulrich J
Format:	Artikel
Sprache:	eng
Schlagworte:	Chemistry Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Physics Scientific imaging Structure and morphology thickness Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) Thin film structure and morphology
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Beschreibung
Zusammenfassung:	A study evaluated the thickness of nonfunctional C18, omega-carboxypentadecyl, and omega-aminododecanoylaminopropyl silane films covalently anchored on quartz and silicon substrates by angle-resolved X-ray photoelectron spectroscopy.
ISSN:	0003-2700 1520-6882
DOI:	10.1021/ac00111a021