Time-of-flight secondary ion mass spectrometry of poly(alkyl methacrylates)

Time-of-flight secondary ion mass spectrometry of poly(alkyl methacrylates)

Top-of-flight secondary ion mass spectrometry (TOF-SIMS) was used to gain insight about polymer fragmentation not available from existing methods.

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Bibliographische Detailangaben
Veröffentlicht in:Analytical chemistry (Washington) 1993-04, Vol.65 (8), p.983-991
Hauptverfasser: Zimmerman, Paul A, Hercules, David M, Benninghoven, Alfred
Format: Artikel
Sprache:eng
Schlagworte:
Applied sciences
Exact sciences and technology
Organic polymers
Physicochemistry of polymers
Polymers
Properties and characterization
Scientific imaging
Structure, morphology and analysis
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Beschreibung
Zusammenfassung:Top-of-flight secondary ion mass spectrometry (TOF-SIMS) was used to gain insight about polymer fragmentation not available from existing methods.
ISSN:0003-2700
1520-6882
DOI:10.1021/ac00056a006