Effect of Sm on YIG: Structural and dielectric properties evaluation

This work aims to identify the effect of samarium (Sm) doped in YIG by using conventional solid-state reaction. The investigation was carried based on 2Y3-xSmxFe5O12 (Smx; x = 0.1-1.5). It is found that from X-ray diffraction analysis (XRD) associated with Rietveld refinement, secondary phases such...

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Bibliographische Detailangaben

Hauptverfasser:	Ahmad, Hisyamuddin Hanif, Rejab, Nik Akmal, Ahmad, Zainal Arifin, Ain, Mohd Fadzil, Othman, Mohammadariff, Ali, Wan Fahmin Faiz Wan
Format:	Tagungsbericht
Sprache:	eng
Schlagworte:	Dielectric properties Hematite Samarium X-ray diffraction Yttrium oxide
Online-Zugang:	Volltext
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